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Conferences

Full Wavelength Dependence of Raman Gain in Optical Fibers: Measurements Using a Single Pump Laser

March 1, 2003

Author(s)

Nathan R. Newbury

The dependence of the Raman gain on both the absolute pump wavelength and the signal-pump wavelength difference can be determined using a simple method that

Managing Content and E-Resources on the NIST Virtual Library (NVL)

March 1, 2003

Author(s)

Susan L. Makar

In May 2002, the Information Services Division (ISD) of Technology Services (TS) at the National Institute of Standards and Technology (NIST) implemented a

What Is the Best Transfer Standard for Gas Flow?

March 1, 2003

Author(s)

John D. Wright

National metrology institutes around the world have embarked on an effort to compare their primary gas flow standards under the supervision of the Comit

Measured Performance of a 35 Kilowatt Roof Top Photovoltaic System

March 1, 2003

Author(s)

Arthur H. Fanney, E R. Weise, K R. Henderson

A 35-kilowatt roof top photovoltaic system has been installed at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland. The system

Molecularly-Imprinted Stationary Phases for Plastic Microchip-Based Capillary Electrochromatography

March 1, 2003

Author(s)

A. C. Henry, David J. Ross, Laurie E. Locascio

Progress in the Development of a Kinetic Database for Heptane Combustion

March 1, 2003

Author(s)

Wing Tsang

This paper deals with the development of a chemical kinetic database for use in the simulation of heptane combustion. The database consists of the thermodynamic

Laser Ultrasound: An Inspection Tool of Soft Porous Low-Dielectric Constant Films for Microelectronic Interconnect

March 1, 2003

Author(s)

Colm Flannery, Donna C. Hurley

The demand for miniaturization in the microelectronics industry requires that the RC (Resistance-Capacitance) factor be lowered to reduce interconnection delay

Submillimeter-Wavelength Plasma Diagnostics For Semiconductor Manufacturing, ed. by D.G. Seiler, A.C. Diebold, T.J. Schaffner, R. McDonald, S. Zollner, R.P. Khosla, and E.M. Secula

March 1, 2003

Author(s)

Eric C. Benck, G Y. Golubiatnikov, Gerald T. Fraser, D L. Pluesquelic, B Ji, S A. Motika, E J. Karwacki

Expected Multi-Hop Power Consumption in Mobile Ad-Hoc Networks

March 1, 2003

Author(s)

Camillo A. Gentile

Mobile Ad-Hoc Networks provide the means to reduce significantly the power required for routing from source to destination through multi-hops between other

Joint Distribution of Link Distances

March 1, 2003

Author(s)

Leonard E. Miller

The calculation of two-hop connectivity between two terminals for randomly deployed wireless networks requires the joint probability distribution of the

A Cognitive Framework for Performance/Resilience Optimized Multipath Routing in Networks with Unstable Topologies

March 1, 2003

Author(s)

Vladimir V. Marbukh

This paper proposes a framework for optimized multipath routing in a wireless network with frequently changing topology. The topology changes may be due to node

Self-Adaptive Leasing for Jini

March 1, 2003

Author(s)

K Bowers, Kevin L. Mills, Scott W. Rose

Distributed computing environments require strategies by which components can detect and recover from failures in remote, collaborating components. Many

Embedded Capacitance Materials and Their Application in High Speed Designs

March 1, 2003

Author(s)

T Bergstresser, R Hilburn, Jan Obrzut, K. M. Phillips

In this paper, we review three material options for embedded capacitors: thin FR4 epoxy-glass laminate, adhesiveless copper on polyimide substrate, and

Uncertainty Budgets For Realisation of Scales By Radiation Thermometry

March 1, 2003

Author(s)

J Fischer, M Battuello, M Sadli, M Ballico, S N. Park, P Saunders, Y Zundong, B. Carol Johnson, E Van der Ham, W Li, F Sakuma, Graham Machin, N Fox, S Ugur, M Matveyev

Some recent international comparisons and the preliminary results of the key comparison CCT-K5 evidenced that the realisation of theITS-90 above the freezing

Electron Backscatter Diffraction for Studies of Localized Deformation

March 1, 2003

Author(s)

R.H. Geiss, Alexana Roshko, Kristine A. Bertness, T Keller

Electron backscatter diffraction (EBSD) was used to study localized deformation in two types of constrained-volume materials. We present a study of deformation

A Primary Standard for 157 nm Excimer Laser Measurements

March 1, 2003

Author(s)

Christopher L. Cromer, Marla L. Dowell, Richard D. Jones, Darryl A. Keenan, Shao Yang

Two primary standard calorimeters have been developed for accurate measurements of 157 nm (F2) excimer laser power and energy. The calorimeter specifications

Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

February 26, 2003

Author(s)

Xiaohong Gu, Mark R. VanLandingham, Michael J. Fasolka, Jonathan W. Martin, J Y. Jean, Tinh Nguyen

In this study, a well-controlled humidity system is used to enhance the sensitivity of A-FM in characterizing surface chemical heterogeneity. The relative

Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy

February 26, 2003

Author(s)

Xiaohong Gu, Tinh Nguyen, Michael J. Fasolka, D Julthongpiput, Lei Chen, Mark R. VanLandingham, Y C. Jean, Jonathan W. Martin

Nanoscale spatial chemical information is essential to developing a molecular-level understanding of a variety of phenomena occurring at surfaces and interfaces

Model for Estimating Wear Transition Loads in Ceramics

February 19, 2003

Author(s)

S Jahanmir

The wear behavior of advanced ceramics (alumina, silicon nitride, and silcon carbide) changes as the load or the coefficient of friction is increased. This

Research on Site Qualifications above 1 GHz

February 18, 2003

Author(s)

Michael Windler, Dennis G. Camell

This is a summary of recent efforts conducted under the auspices of the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub

Intermetallics Formation and Growth at the Interface of Tin-Based Solder Alloys and Copper Substrates

February 17, 2003

Author(s)

Juan C. Madeni, S X. Liu, Thomas A. Siewert

Increasing concerns regarding environmental contamination is driving the soldering research community to develop lead-free solder alloys. Previous studies have

A Linear Programming Based Algorithm for Multiple Sequence Alignments

February 17, 2003

Author(s)

Fern Y. Hunt, Agnes A. O'Gallagher, Anthony J. Kearsley

Computerized Fire Simulations For Use In Fatal Fire Investigations

February 1, 2003

Author(s)

Daniel M. Madrzykowski

Learning Objective: To develop a conceptual understanding of fire modeling, model capabilities and the application of fire models to investigations.In

A Study on the Variance Estimation for a Stationary Process in SPC

February 1, 2003

Author(s)

Nien F. Zhang

Recently, statistical process control (SPC) methodologies have been developed to accommodate autocorrelated data. To construct control charts for stationary

Polymer Dynamics and Diffusive Properties in Ultra-Thin Photoresist Films

February 1, 2003

Author(s)

Christopher L. Soles, Ronald L. Jones, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Vivek M. Prabhu, Wen-Li Wu, Eric K. Lin, D L. Goldfarb, M Angelopoulos

A series of experiments are presented to demonstrate thin film confinement effects on the diffusive properties in poly(tert-butoxycarboxystyrene) (PBOCSt)

Finding Similar Classes with a Simplified Metamodel

February 1, 2003

Author(s)

David W. Flater

To integrate conceptual models and other types of models, it is necessary to identify the portions of the models that overlap (i.e.,find similar classes) and

On Information and Performance of Complex Manufacturing Systems

February 1, 2003

Author(s)

Albert W. Jones, Larry H. Reeker, A S. Deshmukh

This paper makes several critical points related to the intrinsic relationship between information and performance in complex, dynamic systems. Using a

Current Projects in Display Metrology at the NIST Flat Panel Display Laboratory

February 1, 2003

Author(s)

Paul A. Boynton, Edward F. Kelley, John M. Libert

The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the

A Color Gamut Assessment Standard: Construction, Characterization, and Inter-Laboratory Measurement Comparison

February 1, 2003

Author(s)

John M. Libert, Edward F. Kelley, Paul A. Boynton, Steven W. Brown, Christine Wall, Colin Campbell

In earlier papers, NIST proposed a standard illumination source and optical filter targets with which to assess the state-of-the-art of display measurement. The

Receptance Coupling for High-Speed Machining Dynamics Prediction

February 1, 2003

Author(s)

T L. Schmitz, Timothy J. Burns

We apply receptance coupling techniques to predict the tool-point frequency response for high-speed machining applications. Building on early work of Duncan

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