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Frank S. Biancaniello, Tony Zahrah, Rodney D. Jiggetts, L J. Rowland, Steven P. Mates, Stephen D. Ridder, S Glasmachers
Amorphous metal alloys have been developed with sufficiently slow crystallization kinetics to allow the casting of bulk metallic glass (BMG) components up to
A detector-based calibration facility has been developed at the National Institute ofStandards and Technology (NIST) to calibrate irradiance meters with
Critical dimension and overlay metrology are two of the important measurements made in semiconductor device fabrication. Critical dimension metrology is
The dependence of the Raman gain on both the absolute pump wavelength and the signal-pump wavelength difference can be determined using a simple method that
In May 2002, the Information Services Division (ISD) of Technology Services (TS) at the National Institute of Standards and Technology (NIST) implemented a
Distributed computing environments require strategies by which components can detect and recover from failures in remote, collaborating components. Many
T Bergstresser, R Hilburn, Jan Obrzut, K. M. Phillips
In this paper, we review three material options for embedded capacitors: thin FR4 epoxy-glass laminate, adhesiveless copper on polyimide substrate, and
J Fischer, M Battuello, M Sadli, M Ballico, S N. Park, P Saunders, Y Zundong, B. Carol Johnson, E Van der Ham, W Li, F Sakuma, Graham Machin, N Fox, S Ugur, M Matveyev
Some recent international comparisons and the preliminary results of the key comparison CCT-K5 evidenced that the realisation of theITS-90 above the freezing
R.H. Geiss, Alexana Roshko, Kristine A. Bertness, T Keller
Electron backscatter diffraction (EBSD) was used to study localized deformation in two types of constrained-volume materials. We present a study of deformation
Christopher L. Cromer, Marla L. Dowell, Richard D. Jones, Darryl A. Keenan, Shao Yang
Two primary standard calorimeters have been developed for accurate measurements of 157 nm (F2) excimer laser power and energy. The calorimeter specifications
Xiaohong Gu, Mark R. VanLandingham, Michael J. Fasolka, Jonathan W. Martin, J Y. Jean, Tinh Nguyen
In this study, a well-controlled humidity system is used to enhance the sensitivity of A-FM in characterizing surface chemical heterogeneity. The relative
Xiaohong Gu, Tinh Nguyen, Michael J. Fasolka, D Julthongpiput, Lei Chen, Mark R. VanLandingham, Y C. Jean, Jonathan W. Martin
Nanoscale spatial chemical information is essential to developing a molecular-level understanding of a variety of phenomena occurring at surfaces and interfaces
The wear behavior of advanced ceramics (alumina, silicon nitride, and silcon carbide) changes as the load or the coefficient of friction is increased. This
This is a summary of recent efforts conducted under the auspices of the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub
Increasing concerns regarding environmental contamination is driving the soldering research community to develop lead-free solder alloys. Previous studies have
Recently, statistical process control (SPC) methodologies have been developed to accommodate autocorrelated data. To construct control charts for stationary
Christopher L. Soles, Ronald L. Jones, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Vivek M. Prabhu, Wen-Li Wu, Eric K. Lin, D L. Goldfarb, M Angelopoulos
A series of experiments are presented to demonstrate thin film confinement effects on the diffusive properties in poly(tert-butoxycarboxystyrene) (PBOCSt)
To integrate conceptual models and other types of models, it is necessary to identify the portions of the models that overlap (i.e.,find similar classes) and
This paper makes several critical points related to the intrinsic relationship between information and performance in complex, dynamic systems. Using a
The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the
John M. Libert, Edward F. Kelley, Paul A. Boynton, Steven W. Brown, Christine Wall, Colin Campbell
In earlier papers, NIST proposed a standard illumination source and optical filter targets with which to assess the state-of-the-art of display measurement. The
We apply receptance coupling techniques to predict the tool-point frequency response for high-speed machining applications. Building on early work of Duncan
Highly accelerated electromigration tests conducted at wafer level require meaningful measurements of the stress temperature of the test line. Estimates of the
A set of computer tools was developed to assist fire protection engineers with the analysis of Cone calorimeter data for modeling. The tools consist of various
There is a critical need in the law enforcement community to ensure the reliability of computer forensic tools. A capability is required to ensure that forensic
As the ability to predict fire conditions in buildings using sensor signals improves, these predictions can be used to inform first responders about the