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Conferences

A Repository of Sensor Data for Autonomous Driving Research

April 25, 2003

Author(s)

Michael O. Shneier, Tommy Chang, Tsai Hong Hong, Geraldine S. Cheok, Harry A. Scott, Steven Legowik, Alan M. Lytle

We describe a project to collect and disseminate sensor data for autonomous mobility research. Our goals are to provide data of known accuracy and precision to...

Moving Object Prediction for Off-road Autonomous Navigation

April 25, 2003

Author(s)

Rajmohan Madhavan, Craig I. Schlenoff

The realization of on- and off-road autonomous navigation of Unmanned Ground Vehicles (UGVs) requires real-time motion planning in the presence of dynamic...

Ground Truth and Benchmarks for Performance Evaluation

April 25, 2003

Author(s)

A Takeuchi, Michael O. Shneier, Tsai H. Hong, Christopher J. Scrapper Jr, Geraldine Cheok

Progress in algorithm development and transfer of results to practical applications such as military robotics requires the setup of standard tasks, of standard...

Broadband Permittivity and Loss Tangent Measurements Using a Split-Cylinder Resonator

April 24, 2003

Author(s)

Michael D. Janezic, Edward Kuester, James R. Baker-Jarvis

We summarize a theoretical model for the split-cylinder resonator, based on the mode-matching method, for performing nondestructive permittivity and loss...

Effects of In-Situ Burning on Coastal Wetlands: Soil Temperatures and Regrowth of Marsh Plant Species

April 6, 2003

Author(s)

Nelson P. Bryner, William D. Walton, I. A. Mendelssohn, Q. Lin, J. V. Mullin

Twenty-one full-scale in-situ burn experiments examined soil temperatures which marsh plants experience during in-situ burning. Two hundred sixty four plant...

Overview of Metrology for the Semiconductor Industry at the National Institute of Standards and Technology

April 4, 2003

Author(s)

Stephen Knight

Semiconductor metrology developments at NIST have been conducted since the 1950s, covering a wide range of topics, including investigation of the causes of...

A Single Photon On-Demand Source With Decoupled Single and Multiphoton Probabilities: Initial Results

April 1, 2003

Author(s)

Alan L. Migdall, D A. Branning, Stefania Castelletto, M J. Ware

As currently implemented, single photon sources cannot be made to producesingle photons with high probability, while simultaneously suppressingthe probability...

The NIST Smart Space and Meeting Room Projects: Signals, Acquisition, Annotation, and Metrics

April 1, 2003

Author(s)

Vincent M. Stanford, John S. Garofolo, O P. Galibert, Martial Michel, Christophe Laprun

Pervasive Computing devices, sensors, and networks, provide infrastructure for context aware smart meeting rooms that sense ongoing human activities and respond...

Multichannel Decomposition of Heptyl Radicals

April 1, 2003

Author(s)

Wing Tsang, Iftikhar A. Awan, Jeffrey A. Manion

This paper is concerned with decomposition of heptyl radicals in high temperature combustion environments. Experimental results on the decomposition of n-heptyl...

Quantifying Cell-Response to Materials Through Population Analyses Enabled by High-Throughput Techniques

April 1, 2003

Author(s)

S B. Kennedy, Ying Mei, R Gross, N Washburn, Eric J. Amis

Efforts in combinatorial materials science at NIST have evolved into three interwoven toolsets for exploring cell response to materials: material library...

Reference Material 8457, Ultra High Molecular Weight Polyethylene 0.5 cm Cubes

April 1, 2003

Author(s)

B M. Fanconi, John A. Tesk, William F. Guthrie

The geometric and surface features of a new NIST reference material, RM 8457 are presented. This reference material is composed of Ultra High Molecular Weight...

Determination of Pore Size Distributions in Nanoporous Low-K Thin Films From Small Angle Neutron Scattering

April 1, 2003

Author(s)

Barry J. Bauer, R C. Hedden, Hae-Jeong Lee, Christopher L. Soles, Da-Wei Liu

Small angle neutron and x-ray scattering (SANS, SAXS) are powerful tools in determination of the pore size and content of nano-porous materials with low...

Performance Evaluation of Approaches to Combining Results From Multiple Methods

April 1, 2003

Author(s)

Hung-Kung Liu, Nien F. Zhang

The problem of determining a consensus mean and its uncertainty from the results of multiple measurement methods or laboratories is an important problem. Many...

A Model System for Interfacial Reactions in LTCC Materials

April 1, 2003

Author(s)

Lawrence P. Cook, Winnie K. Wong-Ng, Peter K. Schenck, Mark D. Vaudin, J Suh

Over the past decade, ceramic packaging materials have continued to increase in both chemical and structural complexity. At processing temperatures of 800 C to...

Characterization of Nanoporous Low-k Thin Films by Contrast Match SANS

April 1, 2003

Author(s)

R C. Hedden, Barry J. Bauer, Hae-Jeong Lee

Small-angle neutron scattering (SANS) contrast variation is used to characterize matrix properties and pore size in nanoporous low-k thin films. Using a vapor...

The Development and Application of Cryocoolers Since 1985

April 1, 2003

Author(s)

Ray Radebaugh

Many significant new developments in cryocoolers have occurred since about 1985 that have lead to grealy improved efficiencies, lifetimes, compactness, and low...

NIST Methods of Estimating the Impurity Uncertainty Component for ITS-90 Fixed-Point Cells from the Ar TP to the Ag FP

April 1, 2003

Author(s)

Gregory F. Strouse

The NIST Platinum Resistance Thermometry Laboratory uses International Temperature Scale of 1990 (ITS-90) fixed-point cells to calibrate standard platinum...

Artificial Neural Networks Methods Applied to Conductometric Microhotplate Data for the Identification of the Type and Relative Concentration of Chemical Warfare Agents

April 1, 2003

Author(s)

Zvi Boger, Douglas C. Meier, Richard E. Cavicchi, Stephen Semancik

Response data from microhotplate (MHP) sensor arrays were measured for various chemical warfare (CW) agents at several concentrations. Efficient large-scale...

XML for Exchange of Weld Inspection Results

April 1, 2003

Author(s)

William G. Rippey, Timothy P. Quinn, John L. Michaloski

TECHNICAL SUMMARYIntroduction/Background SectionA system to demonstrate the transfer of weld inspection data between computer programs is described in this...

The NIST Microforce Realization and Measurement Project

April 1, 2003

Author(s)

David B. Newell, Edwin R. Williams, John A. Kramar, Jon R. Pratt, Douglas T. Smith

The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development...

High-Throughput Investigation of Cell Proliferation on Crystalline Polymers

April 1, 2003

Author(s)

N. R. Washburn, S B. Kennedy, Carl Simon Jr., K Yamada, Eric J. Amis

The results of our investigation of cell proliferation on crystalline polymers will be presented. The goal of the research is to investigate how cells respond...

Quantifying Superconformal filling of the Submicrometer Features Through Surfactant Catalyzed Chemical Vapor Deposition

April 1, 2003

Author(s)

Daniel Josell, S D. Kim, Daniel Wheeler, Thomas P. Moffat, S G. Pyo

This work presents the fundamentals for understanding the superconformal deposition observed during surfactant catalyzed chemical vapor deposition. The...

Toward a Real-time Scheduler and Controller for Semiconductor Fabrication Systems

April 1, 2003

Author(s)

Hyeung-Sik Min, Albert T. Jones, Yuehwern Yih

The complexity of a semiconductor fabrication system is high because of complicated product flows, uncertain operation times, variable yields, changing products...

Composite Substrate Research for Large-format HgCdTe IRFPAs

April 1, 2003

Author(s)

N. K. Dhar, Y Chen, P M. Brill, Paul M. Amirtharaj, S Velicu, P Boieriu, Anthony G. Birdwell

Research on silicon based composite substrates is being conducted at the Army Research Laboratory. These substrates can be used to deposit HgCdTe alloys to...

Metrology for Molecular Electronics

March 31, 2003

Author(s)

Curt A. Richter, D R. Stewart

We discuss some of the complex issues associated with the metrology of molecular electronic devices and describe an electrical characterization method to assess...

Junction-Isolated Electrical Test Structures for Critical Dimension Calibration Standards

March 31, 2003

Author(s)

Richard A. Allen, Michael W. Cresswell, Loren W. Linholm

NIST is developing single-crystal reference materials for use as critical dimension (CD) calibration standards. In earlier work, these structures have been...

Precise Calibration for Optical Amplifier Noise Figure Measurement Using the RIN Subtraction Method

March 28, 2003

Author(s)

Gregory E. Obarski

Calibration with a relative intensity noise (RIN) standard significantly improves the RIN subtraction method for measuring the noise figure of an erbium-doped...

Smaller Two-Qubit Circuits for Quantum Communication and Computation

March 20, 2003

Author(s)

V V. Shende, I L. Markov, Stephen Bullock

We show how to implement an arbitrary two-qubit unitary operation using any of several quantum gate libraries with small a priori upper bounds on gate counts...

Energy Consumption Measurements Using AHAM HRF-1 and ISO 8561

March 10, 2003

Author(s)

David A. Yashar

This investigation compares the energy consumption ratings obtained for refrigerators using the Association of Home Appliance Manufacturers (AHAM) HRF-1 test...

Surface and Interface Properties of UV-Exposed PVDF/PMMA-CO-PEA Blends

March 5, 2003

Author(s)

Xiaohong Gu, Li Piin Sung, D L. Ho, Chris A. Michaels, D Nguyen, Y C. Jean, Tinh Nguyen

The surface and interface of PVDF blended with different amounts of poly (methyl methacrylate) and poly (ethyl acrylate) copolymer (PNMA-co-PEA) have been...

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