Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Numerical Experiments in Scattering by a Dielectric Wedge

January 1, 2003

Author(s)

Egon Marx

A general discussion of the scattering of plane monochromatic waves by dielectric wedges precedes this paper. Numerical solutions of the problem of scattering

NIST Accelerator Facilities and Programs in Support of Industrial Radiation Research, ed. by J.L. Duggan and I.L. Morgan

January 1, 2003

Author(s)

Fred B. Bateman, Marc F. Desrosiers, Lawrence T. Hudson, Bert M. Coursey, F. P. Bergstrom, Stephen M. Seltzer

Optical Clocks with Cold Atoms and Stable Lasers

January 1, 2003

Author(s)

Leo W. Hollberg, Christopher W. Oates, G Wilpers, E A. Curtis, C Hoyt, Scott A. Diddams, A Bartels, T M. Ramond

Evaluation of Performance of Integrating Spheres For Indirect Emittance Measurement, ed. by B. Fellmuth, J. Seidel, and G. Scholz

January 1, 2003

Author(s)

Leonard M. Hanssen, Sergey Mekhontsev, Alexander Prokhorov

Machining Damage Cracks: How to Find and Characterize Them by Fractography

January 1, 2003

Author(s)

George D. Quinn, L K. Ives, S Jahanmir

Subsurface machining cracks may control strength and performance of finished ceramics. Previously, machining cracks had been though to be difficult or

Computed Images of Dielectric Strips on a Substrate

January 1, 2003

Author(s)

Egon Marx

Accurate computed optical images of lines and trenches placed on semiconductors are of great interest to the manufacturers of computer components, especially in

Precise phase control of short pulses

January 1, 2003

Author(s)

Jun Ye, D J. Jones, R J. Jones, K W. Holman, S Foreman

Noise Figure vs. PM Noise Measurements: A Study at Microwave Frequencies,

January 1, 2003

Author(s)

Archita Hati, David A. Howe, F L. Walls, D. Walker

This paper addresses two issues: (i) it compares the usefulness of phase-modulation (PM) noise measurements vs. noise figure (NF) measurements in characterizing

Low Scatter Optical System For Emittance and Temperature Measurements

January 1, 2003

Author(s)

Leonard M. Hanssen, Sergey Mekhontsev

Mechanical Behavior of Contact Aluminum Alloy

January 1, 2003

Author(s)

David T. Read, Yi-Wen Cheng, Joseph D. McColskey, R R. Keller

Here we report the results of tensile tests of thin films of Al-0.5 % Cu deposited on bare silicon. This material was on a wafer that was subjected to the

Dynamic Material Properties for Machining Simulation Using the NIST Pulse-Heated Kolsky Bar

January 1, 2003

Author(s)

Richard L. Rhorer

The modeling or simulation of machining processes is important for economically implementing new manufacturing processes such as high-speed milling or

Instrumentation for old gravity, ed. by O. Francis and T. van Dam

January 1, 2003

Author(s)

J E. Faller

New Frequency Comparisons Using GPS Carier-Phase Time Transfer

January 1, 2003

Author(s)

C Hackman, Judah Levine

Reciprocity Principle and the Choice of Reflectance Model for Physically Correct Modeling of Effective Emissivity

January 1, 2003

Author(s)

Leonard M. Hanssen, Sergey Mekhontsev, Alexander Prokhorov

Recent Developments in the Characterization of Anisotropic Void Populations in Thermal Barrier Coatings Using Ultra-Small Angle X-ray Scattering

January 1, 2003

Author(s)

Gabrielle G. Long, T A. Dobbins, Andrew J. Allen, J Ilavsky, P Jemain, A Kulkarni, H Herman

Thermal barrier coatings (TBC) have complex void microstructures which control their in service properties. In the research reported here, ultra-small-angle X

A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM

January 1, 2003

Author(s)

Xuezeng Zhao, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, C Nguyen

Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro

Phase stabilization of modelocked lasers

January 1, 2003

Author(s)

Steven T. Cundiff, T M. Fortier, D J. Jones, Jun Ye

Timekeeping and time dissemination in a distributed space-based clock ensemble

January 1, 2003

Author(s)

S Francis, B J. Ramsey, S R. Stein, J Leitner, M Moreau, R Burns, R A. Nelson, T R. Bartholomew, A Gifford

Highly Charged Ion Bombardment of Silicon Surfaces Applications of Accelerators in Research and Industry, ed. by J.L. Duggan

January 1, 2003

Author(s)

Lori S. Goldner

Numerical Analysis of a Coaxial Line Terminated with a Complex Gap Capacitance

January 1, 2003

Author(s)

Jan Obrzut, A Anopchenko

Scale-Space Analysis of Line Edge Roughness on 193 nm Lithography Test Structures

January 1, 2003

Author(s)

Ndubuisi G. Orji, Theodore V. Vorburger, Xiaohong Gu, Jayaraman Raja

Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non

PARCS Magnetic Field Measurement: Low Frequency Majorana Transitions and Magnetic Field Inhomogeneity

January 1, 2003

Author(s)

Jon H. Shirley, Steven R. Jefferts

A Quantum-Based Microwave Power Measurement Performed with a Miniature Atomic Fountain

January 1, 2003

Author(s)

Elizabeth A. Donley, T P. Crowley, Thomas P. Heavner, B F. Riddle

Scattering by Slightly Non-spherical Particles on Surfaces, ed. by T. Wriedt

January 1, 2003

Author(s)

Thomas A. Germer

Structural Effects of Experimental Comonomers on Conversion and Polymerization Shrinkage of Dental Composites

January 1, 2003

Author(s)

Michael Weir, N D. Richards, Joseph M. Antonucci

Scattering by Wedges

January 1, 2003

Author(s)

Egon Marx

Some of the components of the fields produced by an incident plane monochromatic wave scattered by a wedge diverge near the edge of the wedge. Rigorous

Investigation of instabilities in two-way time transfer

January 1, 2003

Author(s)

Thomas E. Parker, Victor S. Zhang, Angela Mckinley, L M. Nelson, J Rohde, Demetrios Matsakis

Two-way time transfer to airborne platforms using commercial satellite modems

January 1, 2003

Author(s)

Thomas P. Celano, J Warriner, S Francis, A Gifford, P Howe, R Beckman

Characterizing Surface Roughness of Thin Films By Polarized Light Scattering, ed. by A. Duparr {?} and B. Singh

January 1, 2003

Author(s)

Thomas A. Germer, M J. Fasolka

The Structural Evolution of Pore Formation in Low-K Dielectric Thin Films

January 1, 2003

Author(s)

M S. Silverstein, Barry J. Bauer, V. J. Lee, R C. Hedden, B G. Landes, J L. Lyons, B Kern, J Niu, T Kalantar

Specular x-ray reflectivity and small angle neutron scattering were used to characterize changes in the porosity, pore size and pore size distribution on

Was this page helpful?