Conferences

SCUBA-2: a large format submillimeter camera on the James Clerk Maxwell Telescope

January 20, 2003

Author(s)

Wayne Holland, William Duncan, Kent D. Irwin, Anthony Walton, Peter Ade, Ian Robson

SCUBA-2 is a second generation, wide-field submillimeter camera under development for the James Clerk Maxwell Telescope. With over 12,000 pixels, in two arrays...

Time-Division SQUID Multiplexers for Transition-Edge Sensors

January 14, 2003

Author(s)

Kent D. Irwin, James A. Beall, Joern Beyer, Steven Deiker, W.Bertrand (Randy) Doriese, S. L. Ferreira, Gene C. Hilton, Sae Woo Nam, Carl D. Reintsema, Joel Ullom, Leila R. Vale

Microcalorimeters and bolometers based on superconducting transition-edge sensors (TES) are important tools for the detection of photons from millimeter waves...

Electron Energy Loss Spectroscopy of CeO₂-x Nanoparticles

January 7, 2003

Author(s)

W Lijun, H J. Wiesmann, A R. Moodenbaugh, Daniel A. Fischer, Y Zhu, M Suenaga

ria has been widely studied due to its applications, such as a catalyst in vehicle emissions system and an electrolyte material in solid oxide fuel cells...

Building Blocks for a Scalable Quantum Information Processor Based On Trapped Ions

January 1, 2003

Author(s)

Dietrich G. Leibfried, Murray D. Barrett, A Ben-kish, Joseph W. Britton, J Chiaverini, B. L. DeMarco, Wayne M. Itano, Branislav M. Jelenkovic, John D. Jost, Christopher Langer, D Lucas, V Meyer, Till P. Rosenband, M A. Rowe, T Schaetz, David J. Wineland

We describe the underlying concept and experimental demonstration of the basic building blocks of a scalable quantum information processor architecture using...

Characterization of Metal-Oxide Nanoparticles: Synthesis and Dispersion in Polymeric Coatings.

January 1, 2003

Author(s)

Li Piin Sung, Derek L. Ho, S Scierka, M Baghai-Anaraki

Applications for using metal-oxide nanoparticles to optimize UV absorption and to enhance the stiffness, toughness, and service life of polymeric materials...

Cancer Biomarker Validation: Standards and Process - Roles for the National Institute of Standards and Technology (NIST)

January 1, 2003

Author(s)

Peter E. Barker

Rigorous validation of biomarkers at the National Institute of Standards and Technology (NIST) for early detection of cancer differs from similar processes...

High-Throughput Analysis of Telomerase by Capillary Electrophoresis

January 1, 2003

Author(s)

Donald H. Atha, K Miller, A D. Sanow, J Xu, J L. Hess, O C. Wu, Wenhua Wang, S Srivastava, W E. Highsmith

The enzyme telomerase is expressed in 85-90% of all human cancers, but not in normal, non-stem cell somatic tissues. Clinical assays for telomerase in easily...

Oxidative DNA Damage Biomarkers Used in Tissue Engineered Skin

January 1, 2003

Author(s)

H Rodriguez, Pawel Jaruga, M Birincioglu, Peter E. Barker, C D. O'Connell, M. Dizdaroglu

To assure that tissue engineered medical products are free of genetic changes that might occur from inflammation during the development phase of the product...

Effects of Ultraviolet Radiation Exposure on Vinyl Ester Resins: Characterization of Chemical, Physical and Mechanical Damage

January 1, 2003

Author(s)

A Signor, Mark R. VanLandingham, Joannie W. Chin

The increased use of fiber-reinforced vinyl ester composites in outdoor applications has led to questions concerning the environmental durability of these...

Polyelectrolyte Effects in Model Photoresist Developer Solutions: Roles of Base Concentration and Added Salts

January 1, 2003

Author(s)

Vivek M. Prabhu, Ronald L. Jones, Eric K. Lin, Christopher L. Soles, Wen-Li Wu, D L. Goldfarb, M Angelopoulos

Surface Metrology Software Variability in Two-Dimensional Measurements

January 1, 2003

Author(s)

Ndubuisi G. Orji, Theodore V. Vorburger, Xiaohong Gu, Jayaraman Raja

A range of surface texture measurement instruments is available in the market place. Most of the measurement instruments are microcomputer-based systems that...

Numerical Experiments in Scattering by a Dielectric Wedge

January 1, 2003

Author(s)

Egon Marx

A general discussion of the scattering of plane monochromatic waves by dielectric wedges precedes this paper. Numerical solutions of the problem of scattering...

Computed Images of Dielectric Strips on a Substrate

January 1, 2003

Author(s)

Egon Marx

Accurate computed optical images of lines and trenches placed on semiconductors are of great interest to the manufacturers of computer components, especially in...

Dynamic Material Properties for Machining Simulation Using the NIST Pulse-Heated Kolsky Bar

January 1, 2003

Author(s)

Richard L. Rhorer

The modeling or simulation of machining processes is important for economically implementing new manufacturing processes such as high-speed milling or...

A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM

January 1, 2003

Author(s)

Xuezeng Zhao, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, C Nguyen

Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro...

Scale-Space Analysis of Line Edge Roughness on 193 nm Lithography Test Structures

January 1, 2003

Author(s)

Ndubuisi G. Orji, Theodore V. Vorburger, Xiaohong Gu, Jayaraman Raja

Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non...

Scattering by Wedges

January 1, 2003

Author(s)

Egon Marx

Some of the components of the fields produced by an incident plane monochromatic wave scattered by a wedge diverge near the edge of the wedge. Rigorous...

Application of High Pressure/Environmental Scanning Electron Microscopy to Photomask Dimensional Metrology

January 1, 2003

Author(s)

Michael T. Postek, Andras Vladar

The application of high pressure or environmental microscopy techniques is not new to scanning electron microscopy. However, application of this methodology to...

The Validation of CMM Task Specific Measurement Uncertainty Software

January 1, 2003

Author(s)

Steven D. Phillips, Bruce R. Borchardt, A Abackerli, Craig M. Shakarji, Daniel S. Sawyer, P Murray, B Rasnick, K Summerhays, J M. Baldwin, M P. Henke

Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful...

Constitutive Model Data for Machining Simulation Using the NIST Pulse-Heat Kolsky Bar

January 1, 2003

Author(s)

Eric P. Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W. Yoon, Richard J. Fields, D Basak, Timothy J. Burns

A new facility for dynamic material testing using a traditional Kolsky bar with the addition of controlled electrical-resistive pulse heating has been...

UML Model for the IEEE 1451.1 Standard

January 1, 2003

Author(s)

Kang B. Lee, Yuyin Song

The IEEE 1451.1 Standard for Smart Transducer Interface for Sensors and Actuators- Network Capable Application Processor (NCAP) Information Model was...

Thermal Imaging of Metals in a Kolsky-Bar Apparatus

January 1, 2003

Author(s)

Eric P. Whitenton, Richard L. Rhorer, Howard W. Yoon, D Basak, Richard J. Fields, Lyle E. Levine, Timothy J. Burns

For materials testing at elevated temperatures, we describe the design and the development of a resistively heated Kolsky-bar apparatus. The temperature of the...

Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD

January 1, 2003

Author(s)

Jon R. Pratt, David B. Newell, John A. Kramar, Douglas T. Smith

This paper provides an overview of recent efforts at the National Institute of Standards and TEchnology to develop metrology and standards to support general...

Collinear Optical Coherence Microscopy and Confocal Fluorescence Microscopy: A New in Vitro Technique for Tissue Engineering

January 1, 2003

Author(s)

Joy P. Dunkers, Marcus T. Cicerone, N. R. Washburn

Performance Evaluation of a Prototype Machine Tool for Machining Meso-scaled Parts

January 1, 2003

Author(s)

Bradley N. Damazo, M A. Donmez, Michael L. McGlauflin, J B. Werkmeister, Johannes A. Soons, S C. Bryant, Alex Slocum

With the increased prevalence of meso-scaled products and feature sizes, new tools are needed to bridge the gap between fabrication processes tailored for...