Conferences

Computerized Fire Simulations For Use In Fatal Fire Investigations

February 1, 2003

Author(s)

Daniel M. Madrzykowski

Learning Objective: To develop a conceptual understanding of fire modeling, model capabilities and the application of fire models to investigations.In...

A Study on the Variance Estimation for a Stationary Process in SPC

February 1, 2003

Author(s)

Nien F. Zhang

Recently, statistical process control (SPC) methodologies have been developed to accommodate autocorrelated data. To construct control charts for stationary...

Polymer Dynamics and Diffusive Properties in Ultra-Thin Photoresist Films

February 1, 2003

Author(s)

Christopher L. Soles, Ronald L. Jones, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Vivek M. Prabhu, Wen-Li Wu, Eric K. Lin, D L. Goldfarb, M Angelopoulos

A series of experiments are presented to demonstrate thin film confinement effects on the diffusive properties in poly(tert-butoxycarboxystyrene) (PBOCSt)...

Finding Similar Classes with a Simplified Metamodel

February 1, 2003

Author(s)

David W. Flater

To integrate conceptual models and other types of models, it is necessary to identify the portions of the models that overlap (i.e.,find similar classes) and...

On Information and Performance of Complex Manufacturing Systems

February 1, 2003

Author(s)

Albert W. Jones, Larry H. Reeker, A S. Deshmukh

This paper makes several critical points related to the intrinsic relationship between information and performance in complex, dynamic systems. Using a...

Current Projects in Display Metrology at the NIST Flat Panel Display Laboratory

February 1, 2003

Author(s)

Paul A. Boynton, Edward F. Kelley, John M. Libert

The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the...

A Color Gamut Assessment Standard: Construction, Characterization, and Inter-Laboratory Measurement Comparison

February 1, 2003

Author(s)

John M. Libert, Edward F. Kelley, Paul A. Boynton, Steven W. Brown, Christine Wall, Colin Campbell

In earlier papers, NIST proposed a standard illumination source and optical filter targets with which to assess the state-of-the-art of display measurement. The...

Receptance Coupling for High-Speed Machining Dynamics Prediction

February 1, 2003

Author(s)

T L. Schmitz, Timothy J. Burns

We apply receptance coupling techniques to predict the tool-point frequency response for high-speed machining applications. Building on early work of Duncan...

Temperature Determination Methods on Copper Material for Highly Accelerated Electromigration Tests (e.g., SWEAT)

February 1, 2003

Author(s)

Jochen von Hagen, Harry A. Schafft

Highly accelerated electromigration tests conducted at wafer level require meaningful measurements of the stress temperature of the test line. Estimates of the...

Electromigration Discussion Group Summary

February 1, 2003

Author(s)

Harry A. Schafft, James R. Lloyd

Measuring Resin Temperature During Extrusion Using a Fluorescence Technique

January 30, 2003

Author(s)

Anthony J. Bur, S C. Roth, D W. Baugh, K A. Koppi, M A. Spalding, J Gunderson, W C. Buzanowski

We have used a temperature sensitive fluorescent dye, doped into polycarbonate, to monitor the true resin temperature during extrusion processing. The...

Computer Tools to Determine Material Properties for Fire Growth Modeling From Cone Calorimeter Data.

January 27, 2003

Author(s)

Daniel Murphy, M L. Janssens, J Kimble

A set of computer tools was developed to assist fire protection engineers with the analysis of Cone calorimeter data for modeling. The tools consist of various...

NIST CFIT: Testing Disk Imaging Tools

January 27, 2003

Author(s)

James R. Lyle

There is a critical need in the law enforcement community to ensure the reliability of computer forensic tools. A capability is required to ensure that forensic...

Studying the Response of Building Systems to Fire Using a Virtual Cybernetic Building Test-Bed

January 24, 2003

Author(s)

William D. Davis

As the ability to predict fire conditions in buildings using sensor signals improves, these predictions can be used to inform first responders about the...

SCUBA-2: a large format submillimeter camera on the James Clerk Maxwell Telescope

January 20, 2003

Author(s)

Wayne Holland, William Duncan, Kent D. Irwin, Anthony Walton, Peter Ade, Ian Robson

SCUBA-2 is a second generation, wide-field submillimeter camera under development for the James Clerk Maxwell Telescope. With over 12,000 pixels, in two arrays...

Time-Division SQUID Multiplexers for Transition-Edge Sensors

January 14, 2003

Author(s)

Kent D. Irwin, James A. Beall, Joern Beyer, Steven Deiker, W.Bertrand (Randy) Doriese, S. L. Ferreira, Gene C. Hilton, Sae Woo Nam, Carl D. Reintsema, Joel Ullom, Leila R. Vale

Microcalorimeters and bolometers based on superconducting transition-edge sensors (TES) are important tools for the detection of photons from millimeter waves...

Electron Energy Loss Spectroscopy of CeO₂-x Nanoparticles

January 7, 2003

Author(s)

W Lijun, H J. Wiesmann, A R. Moodenbaugh, Daniel A. Fischer, Y Zhu, M Suenaga

ria has been widely studied due to its applications, such as a catalyst in vehicle emissions system and an electrolyte material in solid oxide fuel cells...

Building Blocks for a Scalable Quantum Information Processor Based On Trapped Ions

January 1, 2003

Author(s)

Dietrich G. Leibfried, Murray D. Barrett, A Ben-kish, Joseph W. Britton, J Chiaverini, B. L. DeMarco, Wayne M. Itano, Branislav M. Jelenkovic, John D. Jost, Christopher Langer, D Lucas, V Meyer, Till P. Rosenband, M A. Rowe, T Schaetz, David J. Wineland

We describe the underlying concept and experimental demonstration of the basic building blocks of a scalable quantum information processor architecture using...

Characterization of Metal-Oxide Nanoparticles: Synthesis and Dispersion in Polymeric Coatings.

January 1, 2003

Author(s)

Li Piin Sung, Derek L. Ho, S Scierka, M Baghai-Anaraki

Applications for using metal-oxide nanoparticles to optimize UV absorption and to enhance the stiffness, toughness, and service life of polymeric materials...

Cancer Biomarker Validation: Standards and Process - Roles for the National Institute of Standards and Technology (NIST)

January 1, 2003

Author(s)

Peter E. Barker

Rigorous validation of biomarkers at the National Institute of Standards and Technology (NIST) for early detection of cancer differs from similar processes...

High-Throughput Analysis of Telomerase by Capillary Electrophoresis

January 1, 2003

Author(s)

Donald H. Atha, K Miller, A D. Sanow, J Xu, J L. Hess, O C. Wu, Wenhua Wang, S Srivastava, W E. Highsmith

The enzyme telomerase is expressed in 85-90% of all human cancers, but not in normal, non-stem cell somatic tissues. Clinical assays for telomerase in easily...

Oxidative DNA Damage Biomarkers Used in Tissue Engineered Skin

January 1, 2003

Author(s)

H Rodriguez, Pawel Jaruga, M Birincioglu, Peter E. Barker, C D. O'Connell, M. Dizdaroglu

To assure that tissue engineered medical products are free of genetic changes that might occur from inflammation during the development phase of the product...

Effects of Ultraviolet Radiation Exposure on Vinyl Ester Resins: Characterization of Chemical, Physical and Mechanical Damage

January 1, 2003

Author(s)

A Signor, Mark R. VanLandingham, Joannie W. Chin

The increased use of fiber-reinforced vinyl ester composites in outdoor applications has led to questions concerning the environmental durability of these...

Polyelectrolyte Effects in Model Photoresist Developer Solutions: Roles of Base Concentration and Added Salts

January 1, 2003

Author(s)

Vivek M. Prabhu, Ronald L. Jones, Eric K. Lin, Christopher L. Soles, Wen-Li Wu, D L. Goldfarb, M Angelopoulos

Surface Metrology Software Variability in Two-Dimensional Measurements

January 1, 2003

Author(s)

Ndubuisi G. Orji, Theodore V. Vorburger, Xiaohong Gu, Jayaraman Raja

A range of surface texture measurement instruments is available in the market place. Most of the measurement instruments are microcomputer-based systems that...

Numerical Experiments in Scattering by a Dielectric Wedge

January 1, 2003

Author(s)

Egon Marx

A general discussion of the scattering of plane monochromatic waves by dielectric wedges precedes this paper. Numerical solutions of the problem of scattering...

Computed Images of Dielectric Strips on a Substrate

January 1, 2003

Author(s)

Egon Marx

Accurate computed optical images of lines and trenches placed on semiconductors are of great interest to the manufacturers of computer components, especially in...

Dynamic Material Properties for Machining Simulation Using the NIST Pulse-Heated Kolsky Bar

January 1, 2003

Author(s)

Richard L. Rhorer

The modeling or simulation of machining processes is important for economically implementing new manufacturing processes such as high-speed milling or...

A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM

January 1, 2003

Author(s)

Xuezeng Zhao, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, C Nguyen

Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro...

Scale-Space Analysis of Line Edge Roughness on 193 nm Lithography Test Structures

January 1, 2003

Author(s)

Ndubuisi G. Orji, Theodore V. Vorburger, Xiaohong Gu, Jayaraman Raja

Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non...