Conferences

Effects of Lightpipe Proximity on Si Wafer Temperature in Rapid Thermal Processing Tools

January 1, 2003

Author(s)

K G. Kreider, D H. Chen, W A. Kimes, D P. DeWitt, Benjamin K. Tsai

A 193 nm Laser Detector Nonlinearity Measurement System

January 1, 2003

Author(s)

Darryl A. Keenan, Holger Laabs, Shao Yang, Marla L. Dowell

To meet the semiconductor industry's demands for accurate measurements, we have developed a method to characterize the nonlinear response of 193 nm excimer

Probe-Force Calibration Experiments Using the NIST Electrostatic Force Balance

January 1, 2003

Author(s)

Jon R. Pratt, David B. Newell, John A. Kramar, J Mulholland, Eric P. Whitenton

The sensitivity of a piezoresistive cantilever force sensor has been determined by probing the weighing pan of the NIST prototype electrostatic force balance

High-Spectral-Purity Microwave Oscillator: Design Using Conventional Air-Dielectric Cavity

January 1, 2003

Author(s)

A Sen Gupta, David A. Howe, Craig Nelson, Archita Hati, F L. Walls, J F. Garcia nava

We report exceptionally low PM and AM noise levels from a microwave oscillator that uses a conventional air-dielectric cavity resonator as a frequency

Rotational Spectra of Chemical Agents and Simulants Using Fourier-Transform Microwave Spectroscopy, ed. by D.A. Berg, U.S. Army Soldier Biological Chemical Command, MD

January 1, 2003

Author(s)

R S. DaBell, R D. Suenram, J O. Jensen, A C. Samuels

Measurements of the Refractive Indices of MOCVD and HVPE Grown AlGAN Films Using Prism-Coupling Techniques Correlated With Spectroscopic Reflection/Transmission Analysis

January 1, 2003

Author(s)

Norman Sanford, Larry Robins, Albert Davydov, Alexander J. Shapiro, Denis V. Tsvetkov, Vladimir A. Dmitriev, Stacia Keller, Umesh Mishra, Steven P. DenBaars

Waveguide prism-coupling methods were used to measure the ordinary and extraordinary refractive indices of Al xGaN films grown on sapphire substrates by HVPE

A New Metrology for Tissue Engineering: Collinear Optical Coherence and Confocal Fluorescence Microscopies

January 1, 2003

Author(s)

Joy Dunkers, Marcus T. Cicerone, Forrest A. Landis, N. R. Washburn

Amplitude noise on supercontinuum generated in microstructure fiber: measurements and simulations

January 1, 2003

Author(s)

Nathan R. Newbury, K L. Corwin, Scott Diddams, Brian R. Washburn, J M. Dudley, S. Coen, R S. Windeler

Coupling Efficiencies in Single Photon On-Demand Sources

January 1, 2003

Author(s)

Stefania Castelletto, Ivo P. Degiovanni, M J. Ware, Alan L. Migdall

Mode-Locked and Single-Frequency Er/Yb Co-Doped Waveguide Lasers

January 1, 2003

Author(s)

John B. Schlager, Berton Callicoatt, Richard Mirin, Norman Sanford

Erbium/ytterbium co-doped planar waveguide lasers are fabricated for low-jitter mode-locked operation and single-frequency operation at 1.54 υm. The passively

Automated Peak Picking and Integration Algorithm for Mass Spectral Data

January 1, 2003

Author(s)

Anthony J. Kearsley, William E. Wallace, Javier Bernal, Charles M. Guttman

Measurements and simulations of noise imposed on supercontinuum generated in microstructure fiber

January 1, 2003

Author(s)

Nathan R. Newbury, K L. Corwin, J M. Dudley, S. Coen, Scott Diddams, K Weber, R S. Windeler

Microsecond Time-Resolved Pyrometry During Rapid Resistive Heating of Samples in a Kolsky Bar Apparatus, ed. by D. Ripple

January 1, 2003

Author(s)

D Basak, Howard Yoon, R Rhorer, T J. Burns

Low-Electron-Energy Cathodoluminescence Study of Polishing and Etching Effects on the Optical Properties of Bulk Single-Crystal Gallium Nitride

January 1, 2003

Author(s)

Larry Robins, B. Steiner, Norman Sanford, Carmen Menoni

Low electron energy cathodoluminescence (LEECL) was used to examine polishing-induced damage in a bulk high-pressure grown GaN single-crystal platelet. The Ga

NIST Reference Material (RM) 8240/2350 Project-Standard Bullets and Casings

January 1, 2003

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Li Ma, M Ols, Eric P. Whitenton

Standard bullets and casings are currently under development to support the National Integrated Ballistics Information System (NIBIN) in the U.S. Based on a

Parallel Configuration for Conjugate Regenerative Dividers

January 1, 2003

Author(s)

J F. Garcia nava, Archita Hati, Craig Nelson, A Sen Gupta, F L. Walls, T Tasset

In this paper we discuss an alternate design of a self-starting conjugate regenerative divider (CRD), which uses two parallel loops instead of one series loop

Temperature Control of Pulse Heated Specimens in a Kolsky Bar Apparatus Using Microsecond Time-Resolved Pyrometry

January 1, 2003

Author(s)

D Basak, Howard Yoon, R Rhorer, T J. Burns, T Matsumoto

Advanced Test and Calibration Systems for Integrated Multi-Sensor Platforms with IR, Visible, and Laser Range Finder/Designator Capabilities

January 1, 2003

Author(s)

Paul Bryant, Jack Grigor, Pat Harris, Brian Rich, Alan Irwin, Steve McHugh, Daniel W. King, Rodney Leonhardt

This paper discusses recent advances in the development of test and evaluation instrumentation for military laser range finder (LRF) and designation systems

A Study of the Effects of Matrix and Laser Energy on the Molecular Mass Distribution of Synthetic Polymers

January 1, 2003

Author(s)

S Wetzel, Charles M. Guttman, Kathleen M. Flynn

A 420 MHz Cr:forsterite femtosecond ring laser and its use for continuum generation in the 1-2 micron range

January 1, 2003

Author(s)

I Thomann, Scott Diddams, A Bartels, K L. Corwin, Nathan R. Newbury, Leo W. Hollberg, J W. Nicholson, M. F. Yan

Improving Neutron Source Calibrations at the National Institute of Standards and Technology

January 1, 2003

Author(s)

J M. Adams, David M. Gilliam

Detection of Trace Water in Phosphine with Cavity Ring-down Spectroscopy

January 1, 2003

Author(s)

Susan Y. Lehman, Kristine A. Bertness, Joseph T. Hodges

Water is a detrimental impurity even at concentrations of 10 nmol/mol or less in source gases for compound semiconductor epitaxial growth. Oxygen complexes from

MALDI-TOF MS Analysis of Chain-End Functionalized Polymers

January 1, 2003

Author(s)

Charles M. Guttman, Barry J. Bauer, Kathryn Beers, S Bencherif, H M. Byrd, Sheng Lin-Gibson

Design Concept for the Microwave Interrogation Structure in PARCS

January 1, 2003

Author(s)

G J. Dick, W M. Klipstein, Thomas P. Heavner, Steven R. Jefferts

The Local Structure of Antimony in High Dose Antimony Implants in Silicon by XAFS and SIMS

January 1, 2003

Author(s)

M A. Sahiner, S W. Novak, Joseph Woicik, Y. Takamura, P B. Griffin, J D. Plummer

One of the important challenges in semiconductor industry is to sustain high concentration of dopant atoms electronically active in very small areas. In

Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques

January 1, 2003

Author(s)

M M. Maska, Jon Martens, Tracy S. Clement, Paul D. Hale, Dylan Williams

This paper discusses the typical uncertainties associated with characterizing high speed photodiodes to 65 GHz when using a vector network analyzer measurement

Combinatorial Edge Delamination Test for Thin Film Adhesion - Concept, Procedure and Results

January 1, 2003

Author(s)

Martin Chiang, R Song, J He, Alamgir Karim, Wen-Li Wu, Eric J. Amis

Precision metrology and interferometry with ultracold calcium atoms

January 1, 2003

Author(s)

E A. Curtis, Christopher W. Oates, Leo W. Hollberg

Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

January 1, 2003

Author(s)

Xiaohong Gu, Mark R. VanLandingham, Michael J. Fasolka, Jonathan W. Martin, J Y. Jean, Tinh Nguyen

Surface finish effects on partial discharge with embedded electrodes

January 1, 2003

Author(s)

Aleta T. Wilder, Robert E. Hebner, Yicheng Wang

Partial discharge measurements have been used to characterize the response of dielectric insulation materials exposed to ac voltages. Electrode surface finish