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Some of the components of the fields produced by an incident plane monochromatic wave scattered by a wedge diverge near the edge of the wedge. Rigorous...
The application of high pressure or environmental microscopy techniques is not new to scanning electron microscopy. However, application of this methodology to...
Steven D. Phillips, Bruce R. Borchardt, A Abackerli, Craig M. Shakarji, Daniel S. Sawyer, P Murray, B Rasnick, K Summerhays, J M. Baldwin, M P. Henke
Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful...
Eric P. Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W. Yoon, Richard J. Fields, D Basak, Timothy J. Burns
A new facility for dynamic material testing using a traditional Kolsky bar with the addition of controlled electrical-resistive pulse heating has been...
The IEEE 1451.1 Standard for Smart Transducer Interface for Sensors and Actuators- Network Capable Application Processor (NCAP) Information Model was...
Eric P. Whitenton, Richard L. Rhorer, Howard W. Yoon, D Basak, Richard J. Fields, Lyle E. Levine, Timothy J. Burns
For materials testing at elevated temperatures, we describe the design and the development of a resistively heated Kolsky-bar apparatus. The temperature of the...
Jon R. Pratt, David B. Newell, John A. Kramar, Douglas T. Smith
This paper provides an overview of recent efforts at the National Institute of Standards and TEchnology to develop metrology and standards to support general...
Bradley N. Damazo, M A. Donmez, Michael L. McGlauflin, J B. Werkmeister, Johannes A. Soons, S C. Bryant, Alex Slocum
With the increased prevalence of meso-scaled products and feature sizes, new tools are needed to bridge the gap between fabrication processes tailored for...
W Oskay, S Bize, Scott A. Diddams, Robert E. Drullinger, Thomas P. Heavner, Leo W. Hollberg, Wayne M. Itano, Steven R. Jefferts, Thomas E. Parker, U Tanaka, C E. Tanner, James C. Bergquist
"Jitter" is the noise modulation due to random time shifts on an otherwise ideal, or perfectly on-time, signal transition. In the absence of ultra-high-speed...
We introduce a statistic that can be used for a particularly difficult measurement prob-lem, namely, determining frequency stability for fre-quency standards and...
We report the first definitive PM and AM noise measurements at 100 GHz of indium phosphide (InP) amplifiers operating at 5 K, 77 K, and room temperature...
Archita Hati, David A. Howe, F L. Walls, D. Walker
This paper addresses two issues: (i) it compares the usefulness of phase-modulation (PM) noise measurements vs. noise figure (NF) measurements in characterizing...