Benck, E.
, Golubiatnikov, G.
, Fraser, G.
, Pluesquelic, D.
, Ji, B.
, Motika, S.
and Karwacki, E.
(2003),
Submillimeter-Wavelength Plasma Diagnostics For Semiconductor Manufacturing, ed. by D.G. Seiler, A.C. Diebold, T.J. Schaffner, R. McDonald, S. Zollner, R.P. Khosla, and E.M. Secula, Characterization and Metrology for ULSI Technology: 2003 International Conference, Austin, TX
(Accessed December 7, 2024)
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Submillimeter-Wavelength Plasma Diagnostics For Semiconductor Manufacturing, ed. by D.G. Seiler, A.C. Diebold, T.J. Schaffner, R. McDonald, S. Zollner, R.P. Khosla, and E.M. Secula
Published
Author(s)
, G Y. Golubiatnikov, , D L. Pluesquelic, B Ji, S A. Motika, E J. Karwacki
Proceedings Title
Characterization and Metrology for ULSI Technology: 2003 International Conference
Volume
C
Conference Dates
March 24-28, 2003
Conference Location
Austin, TX
Conference Title
Proc. 2003 International Conference
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 1, 2003, Updated February 17, 2017