Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Quantifying Cell-Response to Materials Through Population Analyses Enabled by High-Throughput Techniques

Published

Author(s)

S B. Kennedy, Ying Mei, R Gross, N Washburn, Eric J. Amis

Abstract

Efforts in combinatorial materials science at NIST have evolved into three interwoven toolsets for exploring cell response to materials: material library preparation, high-throughput screening, and statistical treatment of population distributions. As the material library available for investigating cell-biomaterial interactions continues to expand, image acquisition and analysis have been exposed as bottlenecks in the high-throughput approach. Furthermore, sampling biases inherent to imaging techniques are amplified as gradient samples are used to facilitate the exploration of a large parameter space. High throughput image acquisition and analysis techniques are now being refined and applied to several material systems. We will report results from these investigations, including a rigorous statistical analysis comparing several parametric and nonparametric tests.
Proceedings Title
Society for Biomaterials, Annual Meeting | 29th | |
Conference Dates
April 1, 2003
Conference Title
Transactions of the Society for Biomaterials

Keywords

automated microscopy, biomaterials, cell culture parametric, nonparametric, statistical analysis

Citation

Kennedy, S. , Mei, Y. , Gross, R. , Washburn, N. and Amis, E. (2003), Quantifying Cell-Response to Materials Through Population Analyses Enabled by High-Throughput Techniques, Society for Biomaterials, Annual Meeting | 29th | | (Accessed December 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2003, Updated February 19, 2017