Precision Wavelength Metrology with a Fourier Transform Spectrometer
D. Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti
We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 105. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of 198Hg.
IMEKO World Congress, Metrology in the 3rd Millennium | XVII | |
, Salit, M.
, Travis, J.
and Sansonetti, C.
Precision Wavelength Metrology with a Fourier Transform Spectrometer, IMEKO World Congress, Metrology in the 3rd Millennium | XVII | |, Cavtat-Dubrovnik, 1, CR
(Accessed June 5, 2023)