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Precision Wavelength Metrology with a Fourier Transform Spectrometer

Published

Author(s)

D. Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti

Abstract

We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 105. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of 198Hg.
Proceedings Title
IMEKO World Congress, Metrology in the 3rd Millennium | XVII | |
Conference Dates
June 22-27, 2003
Conference Location
Cavtat-Dubrovnik, 1, CR
Conference Title
IMEKO World Congress

Keywords

fourier transform spectrometer, Hg, pressure shift, wavenumber calibration

Citation

Veza, D. , Salit, M. , Travis, J. and Sansonetti, C. (2003), Precision Wavelength Metrology with a Fourier Transform Spectrometer, IMEKO World Congress, Metrology in the 3rd Millennium | XVII | |, Cavtat-Dubrovnik, 1, CR (Accessed March 3, 2024)
Created May 31, 2003, Updated October 12, 2021