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Conferences

Performance of Service-Discovery Architectures in Response to Node Failures

June 1, 2003

Author(s)

Christopher E. Dabrowski, Kevin L. Mills, Andrew L. Rukhin

Current trends suggest future software systems will rely on service-discovery protocols to combine and recombine distributed services dynamically in reaction to...

Security Policy Management for Handheld Devices

June 1, 2003

Author(s)

Wayne Jansen, Athanasios T. Karygiannis, M Iorga, Serban I. Gavrila, Vlad Korolev

The adoption of wireless technologies and handheld devices is becoming widespread in business, industry, and government organizations. The use of handheld...

Cold Discharge of CF₃I in a Simulated Aircraft Engine Nacelle

June 1, 2003

Author(s)

Jiann C. Yang, Samuel L. Manzello, Marc R. Nyden, M D. Connaghan

An aircraft engine nacelle simulator was built to study the dispersion behavior of CF3I, a potential halon 1301 (CF3Br) replacement, at an extremely cold...

Test Facility for Determining the Seasonal Performance of Residential Fuel Cell Systems

June 1, 2003

Author(s)

Mark W. Davis, Arthur H. Fanney

The National Institute of Standards and Technology (NIST) has designed andconstructed a test facility for determining the seasonal performance of residential...

A Fast, Deterministic Source of Single Cr Atoms

June 1, 2003

Author(s)

Jabez J. McClelland, Shannon B. Hill

We produce single Cr atoms on demand by feedback control of loading and loss from a magneto-optical trap. We observe single-atom occupation probabilities of...

Deprotection Volume Characteristics and Line Edge Morphology in Chemically Amplified Resists

June 1, 2003

Author(s)

Ronald L. Jones, C G. Willson, T J. Hu, Vivek M. Prabhu, Christopher L. Soles, Eric K. Lin, Wen-Li Wu, D L. Goldfarb, M Angelopoulos, B C. Trinque

The focus of this paper is the form of spatial heterogeneity of deprotection at the eventual pattern edge. The form results from the packing of fuzzy blobs...

Kolsky Bar With Electrical Pulse Heating of the Sample

June 1, 2003

Author(s)

Eric P. Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W. Yoon, Lyle E. Levine, Richard J. Fields, D Basak, Timothy J. Burns

The accuracy of simulations for modeling of machining processes is often limited due to insufficient knowledge of the material properties during machining...

Synthesis of ultrastable femtosecond pulse trains from an optical reference oscillator

June 1, 2003

Author(s)

A Bartels, T M. Ramond, Scott A. Diddams, Leo W. Hollberg

Iterative Registration of 3D LADAR Data for Autonomous Navigation

June 1, 2003

Author(s)

Rajmohan Madhavan, Elena R. Messina

This paper describes an iterative algorithm for registration of 3D LADAR data. The proposed approach is iconic in nature with suitable modifications to deal...

The Common Industry Format: A Way for Vendors and Customers to Talk About Software Usability

June 1, 2003

Author(s)

Jean C. Scholtz, Emile L. Morse, Sharon J. Laskowski, A Wichansky, K Butler, K Sullivan

One way to encourage software developers to integrate usability engineering into their development process is for purchasers to require evidence of product...

Structural Characterization of Methylsilsequioxane-Based Porous Low-k Thin Films Using X-Ray Porosimetry

June 1, 2003

Author(s)

Hae-Jeong Lee, Christopher L. Soles, Da-Wei Liu, Barry J. Bauer, Eric K. Lin, Wen-Li Wu

X-ray porosimetry is used to characterize structural characteristics, including pore size distribution, average density, wall density, and porosity, of...

Determining Mechanical Properties of 01 Tool Steel from Reverse Computation of Indentation Measurement

June 1, 2003

Author(s)

Li Ma, Samuel R. Low III, Jun-Feng Song, J Zhou

sides obtaining the hardness of materials, indentation test has also been developed as a popular method for investigating mechanical properites. There exist...

Tunnel-Coupled Quantum Dots: Atomistic Theory of Quantum Dot Molecules and Arrays

June 1, 2003

Author(s)

Garnett W. Bryant, Javier Aizpurua, W Jaskolski, M Zielinski

An understanding of how dots couple in quantum dot molecules and arrays is needed so that the possibilities for tailored nanooptics in these systems can be...

Tunneling Induced Fluorescence as a Probe of Electromagnetic Interaction at Nanometre Proximity

June 1, 2003

Author(s)

G Hoffman, Javier Aizpurua, S P. Apell, R Berndt

Fluorescence induced by the tunneling current of a scanning tunneling microscope is used to investigate the electromagnetic coupling of a metal tip and a metal...

Absolute Alignment of the Reference Retroreflectometer at NIST

June 1, 2003

Author(s)

Carl C. Miller

The National Cooperative Highway Research Program (NCHRP Project 05-16) awarded The National Institute of Standards and Technology (NIST) a contract to develop...

Obtaining Spectral Data for Colorimetry

June 1, 2003

Author(s)

Yoshihiro Ohno

Simulation analyses have been conducted on the colorimetric errors associated with the data interval, bandpass, and wavelength errors of a spectrometer, using...

Uncertainty Analysis of Reflectance Colorimetry

June 1, 2003

Author(s)

E A. Early, Maria E. Nadal

The specification of the color of an object is important, sometimes crucially, to its acceptability for an intended application. When quantitative measurements...

Control of Coherent Light and its Broad Applications

June 1, 2003

Author(s)

Jun Ye, R J. Jones, K W. Holman, S M. Foreman, D J. Jones, S T. Cundiff, John L. Hall, T M. Fortier, A Marian

A remarkable synergy has been formed between the technology of precision optical frequency metrology and ultrafast laser science. This has resulted in control...

Towards Modeling the Evolution of Product Families

June 1, 2003

Author(s)

Fujun Wang, Steven J. Fenves, Sudarsan Rachuri, Ram D. Sriram

A strategy successfully used by manufacturing companies is to develop product families so as to offer a variety of products with reduced development costs. This...

Flexible Modeling and Simulation for Mass Customization Manufacturing

June 1, 2003

Author(s)

Guixiu Qiao, R F. Lu, Frank H. Riddick

Mass Customization Manufacturing (MCM) systems possess special characteristics that make the modeling of such systems extremely difficult. These characteristics...

A New Way of Handling Dimensional Meaurement Results for Integrated Circuit Technology

June 1, 2003

Author(s)

Andras Vladar, John S. Villarrubia, Michael T. Postek

The international guidelines for correct expression of measurement results and errors call for a through assessment of the errors, their origin and behavior...

Experimental and numerical investigation of fundamental noise on supercontinuum generated in microstructure fiber

June 1, 2003

Author(s)

Kristan L. Corwin, Nathan R. Newbury, Brian Washburn, Scott A. Diddams, J M. Dudley, S. Coen, R Windeler

Supercontinuua generated in microstructure fiber can exhibit amplitude fluctuations of 70%. Experimental and numerical studies of this broadband noise reveal...

Experimental And Numerical Evaluation Of GaseousAgents For Suppressing Cup-Burner Flames In Low-Gravity

June 1, 2003

Author(s)

F Takahashi, Gregory T. Linteris, V Katta

Longer duration missions to the moon, to Mars, and on the International Space Station (ISS)increase the likelihood of accidental fires. NASA s fire safety...

Probabilistic Description of Wind Effects and Wind Load Factors for Database-Assisted Design

June 1, 2003

Author(s)

S M. Diniz, Emil Simiu

Database-assisted design (DAD) for wind results in structures with reduced material consumption and failure risks, i.e., in improved safety and sustainability...

A Model to Predict Hurricanes Induced Losses for Residential Structures

June 1, 2003

Author(s)

J P. Pinelli, C Subramanian, L. Zhang, K Gurley, A Cope, Emil Simiu, S M. Diniz, S Hamid

This paper presents a practical probabilistic model for the projection of annualized damage costs to residential structures due to hurricanes. The estimation of...

Proposal for a Practical Procedure for the Expression of Uncertainty in Hardness Measurement

June 1, 2003

Author(s)

G Barbato, A G. Germak, Samuel Low

Hardness measurement is widely used in industrial applications for quality control and acceptance testing of products because it is fast, inexpensive and...

Evolutions in Hardness Scales Definition

June 1, 2003

Author(s)

G Barbato, A G. Germak, K -. Herrmann, Samuel Low

A conventional characteristic of hardness measurements in the strong dependency on the official definition of each scale. For this reason, and to assure a good...

Sub-Nanometer Wavelength Metrology of Lithographically Prepared Structures: A Comparison of Neutron and X-Ray Scattering

June 1, 2003

Author(s)

Ronald L. Jones, T Hu, Eric K. Lin, Wen-Li Wu, D M. Casa, Ndubuisi George Orji, Theodore V. Vorburger, P J. Bolton, Z Barclay

The challenges facing current metrologies based on SEM, AFM, and light scatterometry for technology nodes of 157 nm imaging and beyond suggest that the...

Investigation of BARC-Resist Interfacial Interactions

June 1, 2003

Author(s)

C Devadoss, Yijun Wang, R Puligadda, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, E Jablonski, Daniel A. Fischer, S Sambasivan, Eric K. Lin, Wen-Li Wu

Results are reported from studies of (A) surface versus bulk chemistry of BARC materials as a function of cure temperature, (B) the dependence of the thickness...

C₄F₆ 1,3 Hexafluorobutadiene - A New Etching Gas: Studies on Material Compatibility, Behavior in Inductively Coupled Plasma and Etch Processes Performance

June 1, 2003

Author(s)

A Nicoletti, P Srinivasan, M Riva, Eric C. Benck, A N. Goyette, Yicheng Wang, J M. Kim, P Hsieh, A Athayde, Abhay Joshi

Hexafluoro-1,3-butadiene (C 4F 6) is a relatively new etch gas for the manufacturing of semiconductor devices, especially in critical etch processes that need...

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