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Projects/Programs

Displaying 1 - 25 of 50

Electrochemical Processes

Ongoing
In this project we are developing in situ measurements relevant to the electrochemical fabrication, processing, and application of nanostructured materials and

Electronic Material Characterization

Ongoing
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Extreme Atom Probe Tomography

Ongoing
NIST is engaged in a joint effort between the Material Measurement Laboratory (MML) and the Physical Measurement Laboratory (PML) aimed at revolutionizing 3D

GaN Nanowire Growth

Ongoing
GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This

Genomics of Electronic Materials

Ongoing
Our goal is to develop the metrology to enable a materials genomic approach to the discovery and optimization of complex electronic and electromagnetic

High-Speed Electronics

Ongoing
This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of high-frequency

Magnetic Random Access Memory

Ongoing
The program on magnetic random-access memory develops metrology to determine how spin currents can be generated and used to control and manipulate magnetization

Magnetic Resonance Spectroscopy

Ongoing
The Magnetic Resonance Spectroscopy Project strives to be at the forefront of understanding the roles that critical atomic-scale defects play in determining