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Material Measurement Laboratory

Materials Measurement Science Division

Projects/Programs

Displaying 51 - 75 of 99
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METIS

Ongoing
A Metrology Exchange to Innovate in Semiconductors

Metrologies for Non-linear Materials in Impact Mitigation

Ongoing
Overview This project develops fundamental structure-property measurements on model materials and novel material chemistries from quasi-static to dynamic rates. The goal is to foster a materials by design approach for novel energy dissipation and force re-direction mechanisms. Processing-Structure
Nanomaterial-containing Drug Classes graphic

Metrology for Nanomaterials in Medicine

Ongoing
Drug products that incorporate nanomaterials are defined by FDA as non-biological complex drugs (NBCDs). NBCDs are a class of medical products that cannot be defined nor fully identified as traditional small-molecule drugs. NBCDs consist of different components that form a complex hybrid structure

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our
Multifunctional AM Project Page

Multifunctional 3D Printable Polymer-Metal Composites

Ongoing
Recent advances in additive manufacturing (AM) have positioned metals and polymers as two key materials. Typically, AM of these two materials involves incompatible methods and conditions. The novel multifunctional polymer-metal composites in this project incorporate low-melting alloys with
Integrated multi-physics simulation and validation

Multiscale Modeling and Validation of Semiconductor Materials and Devices

Ongoing
The limitations of scaling traditional CMOS (complementary metal-oxide semiconductors) designs have necessitated that the semiconductor industry consider new materials and design concepts. For wide bandgap semiconductor devices, optimization of materials and fabrication processes is needed to
USAXS animation

Multiscale structure and dynamics in advanced technological materials

Ongoing
New technologies increasingly harness materials phenomena that operate across many length-scales: e.g., in selective gas adsorption, additive manufacturing, new alloy designs, or advanced concretes. To overcome technology barriers, it is no longer sufficient just to characterize the materials
Nanocalorimeter Measurements Project

Nanocalorimetry Measurements

Ongoing
Accurate thermodynamic measurements are essential to understand fundamental properties of materials, providing direct and quantifiable insight into the thermodynamics of thin film reactions and phase transitions. Going forward, new classes of materials may only be synthesized as thin films, a scale
Nanocalorimetry for Semiconductors and Semiconductor Process Metrology

Nanocalorimetry for Semiconductors and Semiconductor Process Metrology

Ongoing
In September 2022, NIST published a report titled Strategic Opportunities for U.S. Semiconductor Manufacturing , which cited, among other challenges, the need to understand and improve heat dissipation and performance in advanced microelectronics. Specifically, there needs to be better measurements

Nanometer Scale Measurements of Crack Tips in Glass

Ongoing
Our approach is to fracture glass samples under controlled conditions in order to elucidate fracture mechanisms. Specimen geometries with well-defined fracture mechanics behavior are used to propagate cracks at controlled velocities ranging from 10-11 m s-1 to 102 m s-1. Fracture surfaces are then
Thin film RGTM, both whole sister wafer and diced wafers for NIST Measurement

Nanometer-Scale Planar Reference Materials

Ongoing
In most industrial fabs today, foundry test artifacts (wafers) are used to test metrology tools and monitor process stability. These wafers are made in partnerships between specific materials providers and metrology tool providers and may have limited or no adoption across foundries. In some
CRAFM_on_Au_cube

Nanoscale Property Measurements by Atomic Force Microscopy

Ongoing
Over the past several decades, Atomic Force Microscopy (AFM) has advanced from a technique used primarily for surface topography imaging to one capable of characterizing a range of chemical, mechanical, electrical, and magnetic material properties with nanometer resolution. Such characterizations

Nature of the Threat

Ongoing
"Improving Particle Collection Efficiency of Sampling Wipes used for Trace Chemical Detection", Gillen, Greg and Lawrence, Jeffrey and Sisco, Edward and Staymates, Matthew E. and Verkouteren, Jennifer and Robinson, Elizabeth L. and Bulk, Alexander, Anal. Methods, 14, 581-587 (2022). http://dx.doi
Cannabis

NIST Tools for Cannabis Laboratory Quality Assurance

Ongoing
Since the 1970s, cannabis (marijuana and hemp) and its constituent, Δ 9-tetrahydrocannabinol or THC, have been classified as Schedule I controlled substances. Seized evidence is tested by forensic laboratories, which verify the identity of the plant through macro- and microscopic evaluation and the
Illustrated cube has crystal framework in gray with red balls interspersed in the open spaces.

Performance Metrics for Industrial Gas Separation and Purification

Ongoing
Sorbents in Direct Air Capture (DAC) are exposed to the atmosphere, where they adsorb CO2 then are isolated from atmosphere, the CO2 is driven off by heating or pulling vacuum, refreshing the sorbents. This adsorption-refresh cycle depends not only on the competitive adsorption of CO2 with the other
Point-of-Care Pharmaceutical Manufacturing

Point-of-Care Pharmaceutical Manufacturing & Precision Medicine

Ongoing
We are employing quality by design (QbD) and risk assessment (cause-and-effect) approaches to investigate production technologies ( e.g., drop on demand or inkjet printing platforms) and appropriate analytical control strategies for point-of-care manufacture of narrow therapeutic index drugs
Picture of PBD set up for wavelength measurement

Powder Diffraction SRMs

Ongoing
This program strives to produce the highest-quality, traceable powders and other artifacts for x-ray diffraction calibration. (to be completed)
Image of PBD 3-bounce crystals

Precision X-ray Emission Line Measurements

Ongoing
Precise knowledge of the shape and position of x-ray emission lines is the basis of connecting x-ray diffraction measurements to the Système Internationale d'Unités (SI), the official worldwide standard for making any measurement. Measurements of position of x-ray emission lines have been made been

Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry

Ongoing
Isotopic Analysis for Isotopic Geochemistry, Nuclear Safety, and Materials Science : Atom probe tomography has a significant advantage over other forms of mass spectrometry, which typically have a combined efficiency < 5%, in terms of ionization and detection efficiency. Commercial atom probe
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