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A new publication describes METIS, a Metrology Exchange to Innovate in Semiconductors We are seeking comments on the draft publication through February 16, 2024
First responders, athletes, consumers, and the military rely on protective equipment to prevent blunt trauma from an impact. Understanding of the relationship
Advances in methods, instrumentation and standards promote the development of measurement science capabilities in separation technology and physical-chemical
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with
A comprehensive understanding of how current and next-generation materials impact the performance of semiconductor devices is critical to U.S. Semiconductor
This project develops and applies metrologies and standards for characterizing microstructure and dynamics in advanced functional materials of technological
Nanocalorimetry provides a capability to measure the thermal properties of very small samples and at very fast rates. Materials and interfaces of interest
Advanced methods to measure the thermal properties of thin films and interfaces are required to understand and improve microelectronic device fabrication
Our objective is to develop atomic force microscopy-based methods to measure the structure of crack tips, the rates of crack growth, and the roughness of
We use a variety of measurement tools to gain a full understanding of current drug and explosive threats. Particle size, chemical composition, morphology
NIST has developed an integrated measurement services program for forensic and cannabis testing laboratories to help ensure the quality of routine analysis
NIST Synchrotron beamline characterization of advanced semiconductor materials structure, chemical, electronic, and strain properties has been an ongoing
NIST works to identify, research, and document improvements to current and next-generation detection systems. Emphasis is placed on performance characterization
In measuring performance of submicron optoelectronic devices, such as lasers or light-emitting diodes (LEDs), conventional methods are limited to extrapolations
The COVID-19 pandemic highlighted the need for an agile and resilient pharmaceutical manufacturing and distribution framework. Advancements in manufacturing
The work carried out under this project creates a wide variety of X-ray powder diffraction (XRPD) Standard Reference Materials (SRMs) used to calibrate and
The PBD is making new, state-of-the-art measurements of the wavelengths of select atomic X-ray emission lines. These measurements underpin all precision x-ray
Atom probe microscopy was developed over 50 years ago; however, only within the last 15 years has the technique begun to see widespread use, due to the
Drug overdose deaths continue to rise in the United States. Timely data on the drug landscape is difficult to obtain due to a constantly changing drug supply