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Office of the Director

Projects/Programs

Displaying 426 - 450 of 1602
USGS Map

Earthquake Risk Reduction in Buildings and Infrastructure Program

Ongoing
Objective: The Program’s objective is to develop and advance knowledge which can improve codes, standards, and design guidelines for earthquake risk mitigation of buildings and infrastructure systems with the focus on recovery-based design. These efforts supplement NIST’s role as lead agency for the

E-Authentication

Ongoing
Information regarding recent work can be found at our IDENTITY & ACCESS MANAGEMENT page.

Ecogenotoxicity Measurements of Nanoparticles

Completed
Intended Impact Understanding the potential environmental fate of NPs has direct implications to the US economy, as potential environmental and human health impacts of NPs is one of the main factors slowing the commercialization of this technology. Reducing the uncertainty regarding the

Edge AI

Ongoing
This project: Develops edge learning and edge-enabled collaborative learning algorithms. Develops measurement methods for testing the performance and robustness of edge-learned, and more generally collaboratively learned, AI/ML models. Collaborates with other projects (e.g., 5G/6G Core Network

Efficient Optical Spectroscopy of Single Solid-State Quantum Emitters

Ongoing
For emitters embedded in semiconductors, such as a quantum dot in GaAs, the fluorescence collection efficiency is limited by the large refractive index contrast between the semiconductor in comparison to the surrounding air. This causes most of the light emission to remain trapped in the
Allen Goldstein

Electric Power Metrology and the Smart Grid

Ongoing
Major advancements in electric power generation, transmission, distribution and loads over the last 20 years have led to improvements, reliability, robustness, efficiency and energy security unlike anything from the proceeding 80 years. Combined, this power grid modernization has been called the
Massively parallel wafer-level long-term reliability test system featuring 30 fully functioning mini probe stations each supporting 100 probe pins with all the supporting stress/measure electronics integrated (without cables).

Electrical Characterization of Nanoscale Electron Devices

Ongoing
Over the decades, many measurement methods were developed to meet the needs of advancing electron device/circuit/system technology. As technology continue to advance, new needs continue to surface, either due to old measurements are no longer adequate or due to no established method exists. A case
Electric Field Gradient reference prototype

Electrical Scanning Probe Microscopy

Ongoing
Electrical scanning probe microscopes (eSPMs) are a subset of scanning probe microscopes which measure some electrical parameter as well as surface topography. These include techniques such as scanning capacitance microscopy (SCM), scanning spreading resistance microscopy (SSRM), conductive atomic
surface acoustic wave sensor

Electroacoustic Wave-Based Flow Sensors

Ongoing
As part of our NIST-on-a-Chip efforts, we are developing strategies to measure local flow in microfluidic systems. This project will develop label-free flow sensors using surface acoustic waves embedded in microfluidic devices. In this approach, an electromechanical transducer is placed on a

Electrochemistry

Ongoing
Operando Measurements Measurements of the structure and dynamics of metal-electrolyte interfaces are essential for understanding mechanisms of electrocatalysis and electrodeposition that are key to optimization of materials processing and utilization in wet chemical environments. Our measurement
Field Parameter Metrology 2

Electromagnetic Field Strength Metrology

Ongoing
NIST calibrates electrically-small field probes from 10 megahertz – 40 gigahertz. These measurements are done in facilities that are periodically compared against other National Metrology Institutes in conjunction with the Bureau International des Poids et Mesures (BIPM). This assures international
EBIT

Electron Beam Ion Trap (EBIT) Facility

Ongoing
The NIST EBIT is a table-top device which can produce matter in excess of ten million degrees Kelvin. At these temperatures, even the heaviest atoms shed most of their electrons. The highly charged ions which result are trapped by a configuration of electric and magnetic fields in an ultrahigh
Three-dimensional view of carbon nanostructures grown on the surface of a glass fiber

Electron Microscopy of Carbon Nanotube Composites

Ongoing
Multi-wall CNTs (MWCNTs) are a common nano-carbon reinforcement material and are frequently dispersed into a polymer matrix to form composites that can be engineered with specific combinations of desirable properties – electrical, thermal, optical and mechanical, etc. However, this
Electron Spin Resonance at the Single Atom Level Entanglement

Electron Spin Resonance at the Single Atom Level

Ongoing
To study electron spin resonance (ESR) on single atoms requires a tool that can probe at atomic length scales. The scanning tunneling microscope (STM) is ideally suited for this, using a tunneling current to probe surfaces. To implement this ESR-STM combination, we send a radio frequency (RF
solar cells

Electron-Beam Irradiation of Solar Cells

Ongoing
NIST irradiates solar cells that are manufactured by leading developers of high-efficiency solar photovoltaic cells for space applications. As part of the space-qualification process, the performance of these cells in a space environment must be validated. This validation process includes the
Electron-beam lithography

Electron-beam lithography

Ongoing
Electron-beam lithography allows fine control of nanostructure features that form the basis of diverse device technologies. Lateral resolution of 10 nm, placement accuracy of 1 nm, and patterning fields of 1 mm are all possible. However, achieving these performance metrics depends on many
modular measurement platform

Electronic Biophysical Measurements

Ongoing
We develop measurements that leverage electronic signal transduction using FETs to maximize sensitivity and improve the resolution of biomolecular measurements. The techniques allow direct charge transduction during molecular interactions to quantify fundamental biophysical processes. Critically the
2D Material Electronic Test

Electronic Material Characterization

Ongoing
Manufacturing optimized devices that incorporate newly-emerging materials requires predictable performance throughout device lifetimes. Unexpected degradation in device performance, sometimes leading to failure, is often traceable to poor material reliability. Reliability is rooted in the stability

Electronic Structure and Dynamics in Quantum Materials

Ongoing
Photoemission-based methods that interrogate solid state electronic structure have played a pivotal role in identifying and understanding key features of emerging materials. Band structure information from Angle-Resolved PhotoEmission Spectroscopy (ARPES) provided the first evidence for the d-wave
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