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Projects/Programs

Displaying 1 - 25 of 49

Atomic-force microscopy

Ongoing
Atomic-force microscopy is a reference method for traceable and correlative measurements of nanostructures. The Nanostructure Fabrication and Measurement Group

Biomolecular assembly

Ongoing
Biomolecular assembly allows the integration of nanoscale components into functional nanostructures. The Nanostructure Fabrication and Measurement Group

Dynamic Nanoflow Metrology

Ongoing
Current work, within the NIST on a Chip Program, includes developing microfluidic systems that improve the accuracy of flow measurements, which are fundamental

Electron-beam lithography

Ongoing
Electron-beam lithography enables fine control of nanostructure features that form the basis of diverse nanotechnologies. The Nanostructure Fabrication and

Electronic Biophysical Measurements

Ongoing
Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to

Electron-Solid Interactions

Ongoing
Fundamental understanding of electron-solid interactions is key to interpreting electron microscopy images for quantitative metrology. Scanning electron

Focused-ion-beam machining

Ongoing
Focused-ion-beam machining is a powerful method to directly form complex nanostructures. The Nanostructure Fabrication and Measurement Group develops novel