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Search Publications by: Dylan Williams (Fed)

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Displaying 51 - 75 of 293

EMC and Metrology Challenges for 5G and Beyond

December 7, 2018
Author(s)
Perry F. Wilson, Catherine A. Remley, William F. Young, Camillo A. Gentile, John M. Ladbury, Dylan F. Williams
The potential to connect people and devices anywhere and anytime is driving the development and deployment of a multitude of wireless systems. Wireless connectivity is central to advanced communication technologies, the internet of things (IoT), the smart

Propagation of Compact-Modeling Measurement Uncertainty to 220 GHz Power-Amplifier Designs

November 5, 2018
Author(s)
Jerome Cheron, Dylan Williams, Konstanty Lukasik, Richard Chamberlin, Benjamin Jamroz, Erich N. Grossman, Wojciech Wiatr, Dominique Schreurs
We studied the impact of measurement uncertainties in a HBT model and their consequences on the electrical performance under large signal conditions at 9 GHz. Then we use the model with uncertainties to verify the ability of our model to accurately predict

A Systematic Study: Channel Sounding via Modal Expansion

November 3, 2018
Author(s)
Alex Yuffa, Ben Jamroz, Jake Rezac, Dylan Williams
We present preliminary results of using a modal (partial wave) expansion of the field to characterize a propagation channel. We assume that the measurements of the scalar, two-dimensional field from which the modal expansion coefficients are obtained

Measurement and Modeling of Heterogeneous Chip-Scale Interconnections

October 22, 2018
Author(s)
Richard A. Chamberlin, Dylan F. Williams
We present precision scattering-parameter measurements of chip-to-chip connections in heterogeneous integrated circuits: indium phosphide or gallium nitride “chiplets” mounted on SiCMOS carrier chips. We demonstrate methodology, experimental results, and

On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls

October 14, 2018
Author(s)
Dylan Williams, Jerome Cheron, Ben Jamroz, Richard Chamberlin
We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower

Waveform metrology: Signal measurements in a modulated world

August 3, 2018
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey
In this work, we review the \full waveform metrology" concept that we introduced at the National Institute of Standards and Technology. Under this paradigm the full waveform and its functional representation is the target measurand. From the waveform

A Self-Calibrated Transfer Standard for Microwave Calorimetry

July 8, 2018
Author(s)
Dazhen Gu, Xifeng Lu, Ben Jamroz, Dylan Williams, Billy F. Riddle, Xiaohai Cui
We develop a new calibration technique for measuring the correction factor of a calorimeter with a vector network analyzer. Based on a wave-parameter formulation, we develop analytic formulas for the correction-factor ($g$) and effective-efficiency ($\eta$

Impact of Phase Calibration on EVM Measurement Quality

June 14, 2018
Author(s)
Diogo Ribeiro, Dylan Williams, Richard Chamberlin, Nuno B. Carvalho
In this paper, the calibrated measurement of wideband modulated signals by mixer-based large-signal network analyzers (LSNAs) will be evaluated, with a focus on the impact of the phase calibration in the measured error vector magnitude (EVM). The

Importance of Preserving Correlations in Error-Vector-MagnitudeUncertainty

June 14, 2018
Author(s)
Ben Jamroz, Dylan Williams, Kate Remley, Rob Horansky
Correlations are an important consideration in the uncertainty analysis of high-frequency electronic systems. We introduce a method to scramble the correlations of a correlated uncertainty analysis and develop a software tool to do this as part of the NIST

A NIST Testbed Approach to Verifying mmWave Wireless Communication Signals

January 18, 2018
Author(s)
Catherine A. Remley, Dylan F. Williams, Robert D. Horansky
This presentation discusses NIST methods for providing traceable modulated signals at microwave and millimeter-wave frequencies in both conducted and free-field environments. It was presented at the 3rd NSF mmWave Research Coordination Network Workshop in

Hybrid Characterization of Nanolitre Dielectric Fluids in a Single Microfluidic Channel up to 110 GHz Song

December 1, 2017
Author(s)
Nathan D. Orloff, Song Liu, James C. Booth, Dylan F. Williams, Dominec Schreurs, Bart Nauwelaers, Iija Oclet, Charles A. Little
In this work, we present a new “hybrid” method for dielectric measurements of nanolitre fluid samples on-wafer. The first part of the hybrid method is a technique which extracts the 4 complex permittivity of the microfluidic channel wall material. The

The Role of Filtering Higher Order Reflections in Antenna Extrapolation Measurements

September 30, 2017
Author(s)
Rob Horansky, Mohit S. Mujumdar, Dylan Williams, Kate Remley, David R. Novotny, Michael H. Francis
With more and more wireless devices being made with no test ports, and with the need to test these devices in real-world scenarios with no cable interference, over-the-air (OTA) testing has been dominating the test and manufacture industry. At NIST, we are

Measurement Challenges for 5G and Beyond

July 14, 2017
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Joshua A. Gordon, Alexandra E. Curtin, David R. Novotny, Christopher L. Holloway, Robert D. Horansky, Michael S. Allman, Jeanne T. Quimby, Camillo A. Gentile, Peter B. Papazian, Ruoyu Sun, Damir Senic, Jelena Senic, Matthew T. Simons, Maria G. Becker, Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Ari D. Feldman, Paul D. Hale, Mohit S. Mujumdar, Nada T. Golmie
National Metrology Institutes (NMIs) around the world are charged with supporting industry through improved measurement science and by providing a traceability path to fundamental physical standards. Mobile wireless communications have become a ubiquitous

Software Tools for Uncertainty Evaluation in VNA Measurements: A Comparative Study

June 8, 2017
Author(s)
Gustavo Avolio, Dylan Williams, Michael Frey, Sarah B. Streett, Dominique Schreurs, Andrea Ferrero, Michael Dieudonne
We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte

Channel Sounder Measurement Verification and Uncertainty

June 2, 2017
Author(s)
Catherine A. Remley, Jeanne T. Quimby, Paul D. Hale, Dylan F. Williams, Jeffrey A. Jargon, Rodney W. Leonhardt
This presentation describes channel-sounder measurement verification procedures including options such as comparing measurements to theory, conducted tests of a known, simulated-channel artifact, direct over-the-air comparison to a vector network analyzer