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PUBLICATIONS

Confidence and Prediction Intervals for Microwave Measurements: Probe-to-Probe Coupling Corrections

Published

Author(s)

Dylan F. Williams, Benjamin F. Jamroz, Jake D. Rezac

Abstract

We discuss the estimation of confidence and prediction intervals for microwave measurements and highlight the difficulties of applying a conventional approach when correlations must be preserved in the uncertainty analysis. We then suggest an alternative and illustrate the procedures with probe-to-probe coupling corrections in an on-wafer measurement environment.
Proceedings Title
International Microwave Symposium Digest, 2019
Conference Dates
June 2-7, 2019
Conference Location
Boston, MA
Conference Title
2019 International Microwave Symposium
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG.2019.8739193
Local Download

Keywords

Confidence intervals, coupling corrections, on-wafer measurement, prediction intervals
Advanced communications

Citation

Williams, D. , Jamroz, B. and Rezac, J. (2019), Confidence and Prediction Intervals for Microwave Measurements: Probe-to-Probe Coupling Corrections, International Microwave Symposium Digest, 2019, Boston, MA, [online], https://doi.org/10.1109/ARFTG.2019.8739193 (Accessed October 10, 2025)

Issues

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Created May 31, 2019, Updated October 15, 2020
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