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EMC and Metrology Challenges for 5G and Beyond

Published

Author(s)

Perry F. Wilson, Catherine A. Remley, William F. Young, Camillo A. Gentile, John M. Ladbury, Dylan F. Williams

Abstract

The potential to connect people and devices anywhere and anytime is driving the development and deployment of a multitude of wireless systems. Wireless connectivity is central to advanced communication technologies, the internet of things (IoT), the smart grid and smart homes, next-generation automotive technologies, and smart manufacturing, to name a few examples. This connected future will involve faster modulation rates, higher frequencies, smart antennas, multiple-input, multiple-output (MIMO) links, dynamic spectrum allocation, and more. Supporting these radiated technologies will require advances in fundamental microwave metrology, antenna characterization, and electromagnetic compatibility (EMC) test methods. The specifics of 5G and beyond systems are yet to be fully defined, as are all the EMC problems that will be encountered. With that caveat, this article discusses some of the metrology and test needs we expect, and what the National Institute of Standards and Technology (NIST) sees as the research challenges to meet them.
Citation
IEEE Electromagnetic Compatibility Magazine
Volume
7
Issue
4

Keywords

Wireless, MIMO, EMC, Metrology

Citation

Wilson, P. , Remley, C. , Young, W. , Gentile, C. , Ladbury, J. and Williams, D. (2018), EMC and Metrology Challenges for 5G and Beyond, IEEE Electromagnetic Compatibility Magazine, [online], https://doi.org/10.1109/MEMC.2018.8637299 (Accessed May 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 7, 2018, Updated April 15, 2019