Hale, P.
, Williams, D.
and Dienstfrey, A.
(2018),
Waveform metrology: Signal measurements in a modulated world, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925591 (Accessed May 3, 2026)
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Waveform metrology: Signal measurements in a modulated world
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In this work, we review the \full waveform metrology" concept that we introduced at the National Institute of Standards and Technology. Under this paradigm the full waveform and its functional representation is the target measurand. From the waveform, traditional parametric descriptions can be derived. Furthermore, temporal waveforms and their frequency-domain representations are given consistent and equal consideration, with traceability to the International System of Units. To support this traceability, emphasis is placed on voltage and current waveforms, their relationships, and the ability to transform both nominal values and their uncertainties from one domain to the other, simultaneously capturing both in the description.Citation
Metrologia
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Created August 3, 2018, Updated March 19, 2019