Jargon, J.
, Williams, D.
and Sanders, A.
(2018),
The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured with a Two-Port Vector Network Analyzer, IEEE Microwave and Wireless Components Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925734
(Accessed October 26, 2025)
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The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured with a Two-Port Vector Network Analyzer
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Abstract
We explore the relationship between scattering-parameters, corrected for switch terms, and scattering-parameters calculated from wave-parameters measured with a two-port vector network analyzer. By deriving the equations for both representations using consistent notation, we clearly demonstrate their equivalence. This result proves that measuring wave-parameters enables us to obtain uniquely-defined scattering parameters for any changes of impedance behind the signal-separation hardware.Citation
IEEE Microwave and Wireless Components Letters
Pub Type
Journals
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Keywords
measurement, switch terms, scattering-parameters, vector network analyzer, wave-parameters
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Created September 24, 2018, Updated June 2, 2021