Published: September 24, 2018
Jeffrey A. Jargon, Dylan F. Williams, Aric W. Sanders
We explore the relationship between scattering-parameters, corrected for switch terms, and scattering-parameters calculated from wave-parameters measured with a two-port vector network analyzer. By deriving the equations for both representations using consistent notation, we clearly demonstrate their equivalence. This result proves that measuring wave-parameters enables us to obtain uniquely-defined scattering parameters for any changes of impedance behind the signal-separation hardware.
Citation: IEEE Microwave and Wireless Components Letters
Pub Type: Journals
measurement, switch terms, scattering-parameters, vector network analyzer, wave-parameters
Created September 24, 2018, Updated March 19, 2019