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The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured with a Two-Port Vector Network Analyzer

Published

Author(s)

Jeffrey A. Jargon, Dylan F. Williams, Aric W. Sanders

Abstract

We explore the relationship between scattering-parameters, corrected for switch terms, and scattering-parameters calculated from wave-parameters measured with a two-port vector network analyzer. By deriving the equations for both representations using consistent notation, we clearly demonstrate their equivalence. This result proves that measuring wave-parameters enables us to obtain uniquely-defined scattering parameters for any changes of impedance behind the signal-separation hardware.
Citation
IEEE Microwave and Wireless Components Letters

Keywords

measurement, switch terms, scattering-parameters, vector network analyzer, wave-parameters

Citation

Jargon, J. , Williams, D. and Sanders, A. (2018), The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured with a Two-Port Vector Network Analyzer, IEEE Microwave and Wireless Components Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925734 (Accessed January 26, 2022)
Created September 24, 2018, Updated June 2, 2021