The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured with a Two-Port Vector Network Analyzer
Jeffrey A. Jargon, Dylan F. Williams, Aric W. Sanders
We explore the relationship between scattering-parameters, corrected for switch terms, and scattering-parameters calculated from wave-parameters measured with a two-port vector network analyzer. By deriving the nist-equations for both representations using consistent notation, we clearly demonstrate their equivalence. This result proves that measuring wave-parameters enables us to obtain uniquely-defined scattering parameters for any changes of impedance behind the signal-separation hardware.