Published: February 01, 2019
Dylan F. Williams, Laurence T. Stant, Martin J. Salter, Nick M. Ridler, Peter Aaen
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimetre-wave amplifier. We make use of the NIST Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of X-parameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.
Citation: IEEE Transactions on Microwave Theory and Techniques
Pub Type: Journals
Measurement uncertainty, microwave amplifiers, power amplifiers, microwave measurement, parameter extraction
Created February 01, 2019, Updated April 04, 2019