Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models
Dylan F. Williams, Laurence T. Stant, Martin J. Salter, Nick M. Ridler, Peter Aaen
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimetre-wave amplifier. We make use of the NIST Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of X-parameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.
IEEE Transactions on Microwave Theory and Techniques