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Search Publications by: Ya-Shian Li-Baboud (Fed)

Displaying 51 - 75 of 75

Using clock accuracy to guide model synthesis in distributed systems: An application in power grid control

September 27, 2010

Author(s)

Dhananjay Anand, Jeffrey Fletcher, Ya-Shian Li-Baboud, Julien M. Amelot, James Moyne

Practical implementations in distributed model based control face a fundamental trade-off between model complexity and the number of modeled nodes. For linear systems, higher order models better capture the behavior of the system at higher frequencies

EDA Performance and Clock Synchronization Over a Wireless Network: Analysis, Experimentation and Application to Semiconductor Manufacturing

November 24, 2009

Author(s)

Dhananjay Anand, Deepak Sharma, Ya-Shian Li-Baboud, James Moyne

Shrinking process tolerances due to decreasing device sizes and increasing chip complexity in semiconductor manufacturing are motivating efforts to improve methods of Equipment Data Acquisition (EDA). Prior work shows that the lack of precise time-stamping

A Time Synchronization Testbed to Define and Standardize Real-Time Model-Based Control Capabilities in Semiconductor Manufacturing

September 28, 2009

Author(s)

Deepak Sharma, Dhananjay Anand, Ya-Shian Li-Baboud, James Moyne

Shrinking process tolerances due to decreasing device sizes and increasing chip complexity in semiconductor manufacturing are motivating efforts to improve methods for real-time networked process control. Prior work shows that the lack of precise time

Improving Data Quality in Embedded Sensor Systems for APC

September 28, 2009

Author(s)

Julien M. Amelot, YaShian Li-Baboud

Achieving next-generation factory (NGF) goals has been an industry challenge for APC applications to acquire a sufficient level of data quality to maximize the benefits of automation. For example, it is difficult to get accurate timestamps because sensor

A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis

October 1, 2008

Author(s)

Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, Ya-Shian Li-Baboud, James Moyne

Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the

Assessment of Industry Research Priorities for Intelligent Sensors and Control

October 1, 2008

Author(s)

YaShian Li-Baboud, Julien M. Amelot, Julien Le Guen, Alan Weber, Paul McGuire

Sensor networks and intelligent control have garnered much excitement among researchers in industry, government, and academia. Revolutionary advances have been made in the deployment of sensors and control systems for driving intelligent applications in a

Semiconductor Manufacturing Equipment Data Acquisition Simulation for Timing Performance Analysis

September 22, 2008

Author(s)

James Moyne, Ya-Shian Li-Baboud, Xiao Zhu, Dhananjay Anand, Sulaiman Hussain

The ability to acquire quality equipment and process data is pertinent for future real-time process control systems to maximize opportunities for semiconductor manufacturing yield enhancement and equipment efficiency. Clock synchronization for accurate

Identity management standards for product life cycle of electronic parts

September 10, 2008

Author(s)

YaShian Li-Baboud, Eric D. Simmon, Yaw S. Obeng

The high profit opportunities, the diffused outsourcing of manufacturing and the structure of distribution networks make the electronics and its components susceptible to counterfeiting. Distinguishing the genuine article from counterfeit is increasingly

Precise Time Synchronization in Semiconductor Manufacturing

October 3, 2007

Author(s)

Vinod Anandarajah, Naveen Kalappa, Julien L. Baboud, Ya-Shian Li-Baboud, James Moyne

In today's fabs, coordination of time-based information throughout the factory and enterprise has become necessary. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as Network Time

Fab-wide Network Time Synchronization - Simulation and Analysis

September 28, 2007

Author(s)

Naveen Kalappa, Vinod Anandarajah, Julien L. Baboud, Ya-Shian Li-Baboud, James Moyne

In today?s fabs, coordination of time-based information throughout the factory and enterprise has become necessary. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as Network Time

Advancing Factory-Wide Data Quality for APC Applications

November 30, 2006

Author(s)

Harvey Wohlwend, Gino Crispieri, Ya-Shian Li-Baboud

Accurate clock synchronization and time stamping plays a significant role in ensuring data quality as the semiconductor industry faces an imminent data explosion with the deployment of Interface A. Standards and Guidelines significantly ease the deployment

Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing

November 30, 2006

Author(s)

Naveen Kalappa, James Moyne, Jonathan Parrott, Ya-Shian Li-Baboud

As benefits begin to be realized for coordination of time-based information throughout the factory and enterprise, the need for synchronization of data at all levels of the enterprise becomes a primary data quality issue. The lack of precise time-stamping

Advancing Towards Factory-Wide Data Quality for APC Applications

September 30, 2006

Author(s)

Harvey Wohlwend, Gino Crispieri, Ya-Shian Li-Baboud

Advancing to the next levels of Advanced Process Control (APC) requires the ability to intelligently merge existing and new data sources in order to refine semiconductor manufacturing. To fully exploit the acquired data points for analyses in APC

Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing

September 30, 2006

Author(s)

James Moyne, Jonathan Parrott, Naveen Kalappa, Ya-Shian Li-Baboud

In this presentation, the practical aspects of implementing time synchronization in today?s fabs will be discussed utilizing experimental analysis of industrial quality networked environments to illustrate the impact of the various components on the time

Intricacies of Time: Demystifying Factory Clock Synchronization and Time Stamping for E-Manufacturing

September 1, 2006

Author(s)

Ya-Shian Li-Baboud, Harvey Wohlwend, Lance Rist, Eric D. Simmon

Accurate clock synchronization and time stamping will play an increasingly significant role in ensuring data quality as the semiconductor industry faces an imminent data explosion and increasing pressure for equipment effectiveness. Accurately time-stamped

Sands of Time: An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment

September 1, 2006

Author(s)

Eric D. Simmon, Ya-Shian Li-Baboud, John V. Messina

Meeting the rising complexity challenges of Advaced Process Control in semiconductor manufacturing requires improvement in the performance of software and networks utilized within the factory. Information must flow expeditiously throughout the APC system

New Industry Requirements for Clock Synchronization and Time Stamping

March 27, 2006

Author(s)

Harvey Wohlwend, Ya-Shian Li-Baboud

This presentation will report on the results of an industry working group studying time synchronization. The working group will present new industry requirements as well as guidelines for improving time synchronization and time stamping. Efficient

Using NTP: Introduction and Recommended Practices

February 28, 2006

Author(s)

YaShian Li-Baboud

With future e-Manufacturing applications requiring precisely synchronized time for merging data from heterogeneous sources, it is necessary to understand the factors causing synchronization degradation in semiconductor factory distributed systems, and how

In Search of the Key to the Lock: Clock Synchronization Issues and Requirements in Semiconductor Manufacturing

October 17, 2005

Author(s)

Ya-Shian Li-Baboud, John V. Messina

Precision time synchronization requirements lie on the horizon for the semiconductor manufacturing industry. The industry has several potential applications that will require a common time base including the capability to rapidly merge semiconductor

An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment

September 24, 2005

Author(s)

Eric D. Simmon, Ya-Shian Li-Baboud, John V. Messina

The semiconductor industry continues to strive for improvements in the fabrication process. The Advanced Process Control (APC) systems supporting the fabrication process are steadily becoming more complex in order to deal with the high levels of automation

Semiconductor Factory and Equipment Clock Synchronization for e-Manufacturing

December 15, 2004

Author(s)

Ya-Shian Li-Baboud, Brad Van Eck

This study describes the potential methods, challenges, and recommendations for addressing factory and equipment clock synchronization and time stamping. The report also discusses why these are critical to the industry as the upcoming generations of tools

Running Out of Time: Improvements Required In Current Semiconductor Factory and Equipment Clock Synchronization for Supporting Future Real-Time Data Collection

September 23, 2004

Author(s)

Ya-Shian Li-Baboud, Brad Van Eck, Eric D. Simmon

Increasing wafer sizes, decreasing critical dimensions, and new material introduction all challenge higher initial yield, lower manufacturing costs, and time to market demands. Among the key issues driving the challenges are monitoring and maintaining

Time Synchronization for Electronic Distributed Systems

May 28, 2004

Author(s)

John D. Gale, Ya-Shian Li-Baboud

Synchronization of clocks in electronic distributed systems has become critical in an increasing number of applications. Accurate knowledge of the correct time facilitates error trapping, productivity, security and safety. By knowing the precise sequence

Semiconductor Factory and Equipment Time Synchronization

February 25, 2004

Author(s)

Ya-Shian Li-Baboud, Brad Van Eck

With the advent of e-manufacturing including automated process control (APC), such as fault detection classification (FDC), more stringent accuracy requirements for time stamps are required to perform analysis intended for process and business critical

Semiconductor Industry IT Needs: Lessons Learned from Across the Engineering Chain

June 1, 2003

Author(s)

Ya-Shian Li-Baboud, Barbara L. Goldstein

This paper presents information gathered during a series of site visits conducted by National Institute of Standards and Technology (NIST) staff between December 2001 and July 2002. A total of six companies were visited, including: Four Integrated Device