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Displaying 26 - 50 of 81

Measurement of the refractive index and thermo-optic coefficient of water near 193 nm

January 1, 2004

Author(s)

John H. Burnett, Simon G. Kaplan

Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 NM

January 1, 2004

Author(s)

John H. Burnett, Simon G. Kaplan

We discuss our approaches for measuring the absolute index (n) and its dependencies on wavelength (dn/d(lambda)) and temperature (dn/dT), of high-purity water for wavelengths near 193 nm, using the minimum deviation prism method and an interferometric

Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 nm

January 1, 2004

Author(s)

Simon G. Kaplan, J H. Burnett

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

November 1, 2003

Author(s)

R Gupta, Simon G. Kaplan

We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the wavelength range from the visible down to the vacuum ultraviolet (VUV). The interferometric

40 Years of Metrology With Synchrotron Radiation at SURF

September 1, 2003

Author(s)

Uwe Arp, Steven E. Grantham, Simon G. Kaplan, Ping-Shine Shaw, Charles S. Tarrio, Robert E. Vest

the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained and

Forty years of metrology with synchrotron radiation at SURF

January 1, 2003

Author(s)

Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E. Grantham, Edward W. Hagley, Simon G. Kaplan, Ping-Shine Shaw, Charles S. Tarrio, Robert E. Vest

Forty Years of Metrology with Synchrtron Radiation at SURF

January 1, 2003

Author(s)

Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E. Grantham, Edward W. Hagley, Simon G. Kaplan, Ping-Shine Shaw, Charles S. Tarrio, Robert E. Vest

Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz

January 1, 2003

Author(s)

Leonard M. Hanssen, Simon G. Kaplan, Sergey Mekhontsev

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

January 1, 2003

Author(s)

Simon G. Kaplan, R Gupta

Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales

January 1, 2003

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales

January 1, 2003

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work sufficiently

Measurement of the refractive index and thermo-optic coefficient of water near 193 nm, ed. by Anthony Yen Page

January 1, 2003

Author(s)

John H. Burnett, Simon G. Kaplan

Measurement of the refractive index and thermo-optic coefficient of water near 193nm, ed. by A. Yen

January 1, 2003

Author(s)

J H. Burnett, Simon G. Kaplan

NIST-NPL Comparison of Mid-infrared Regular Transmittance and Reflectance

January 1, 2003

Author(s)

C J. Chunnilall, F J. Clarke, Leonard Hanssen, Simon G. Kaplan, M P. Smart

Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m

December 1, 2002

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence from

Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K

September 1, 2002

Author(s)

Simon G. Kaplan, M E. Thomas

We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm -1 10000 cm -1 wave number range and temperatures from 10 K to 295 K. The refractive index is determined by a

Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers

January 1, 2002

Author(s)

David W. Allen, E A. Early, Leonard M. Hanssen, Simon G. Kaplan, E Nadal m

Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers

January 1, 2002

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, E A. Early, Maria E. Nadal, David W. Allen

Si as a Standard Material for Infrared Reflectance and Transmittance from 2 ym to 5 ym

January 1, 2002

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials

June 1, 2001

Author(s)

Leonard M. Hanssen, Simon G. Kaplan, Sergey Mekhontsev

To meet the existing demand for measurements of emittance of opaque and semi-transparent materials, a new facility is being built at NIST around a bench-top Fourier spectrometer. This facility will complement existing capabilities for characterization of

Infrared Transmittance Standards-2053, 2054, 2055, and 2056

May 1, 2001

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

Standard Reference Materials: Infrared Transmittance Standards--SRM's 2053, 2054, 2055, and 2056

May 1, 2001

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Standard Reference Materials 2053, 2054, 2055, and 2056 are transmission filters designed to have nominally neutral attenuation over the 2 mm to 25 mm wavelength region, with optical densities near 1, 2, 3, and 4, respectively. The filters are made of

Development of an Adiabatic Laser Calorimeter

January 1, 2001

Author(s)

Leonard M. Hanssen, E Kawate, Simon G. Kaplan, Raju V. Datla

Infrared Refractive Index Measurements using a New Method

January 1, 2001

Author(s)

D Yang, M E. Thomas, W J. Tropf, Simon G. Kaplan

Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements

October 1, 2000

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a high

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