Hanssen, L.
, Kaplan, S.
and Mekhontsev, S.
(2003),
Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz, 8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science , Berlin, GE
(Accessed December 8, 2024)
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Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published
Author(s)
, ,
Proceedings Title
8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science
Conference Dates
June 19-21, 2001
Conference Location
Berlin, GE
Conference Title
Proc. 8th Int'l Symp. Temperature and Thermal Measurements in Industry and Science
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2003, Updated February 17, 2017