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Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz

Published

Author(s)

Leonard M. Hanssen, Simon G. Kaplan, Sergey Mekhontsev
Proceedings Title
8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science
Conference Dates
June 19-21, 2001
Conference Location
Berlin, GE
Conference Title
Proc. 8th Int'l Symp. Temperature and Thermal Measurements in Industry and Science

Citation

Hanssen, L. , Kaplan, S. and Mekhontsev, S. (2003), Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz, 8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science , Berlin, GE (Accessed August 9, 2022)
Created January 1, 2003, Updated February 17, 2017