Kaplan, S.
and Thomas, M.
(2002),
Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K, Cryogenic Optical Systems and Instruments , Conference | 9th | Cryogenic Optical Systems and Instruments IX | SPIE
(Accessed December 13, 2024)
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Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K
Published
Author(s)
, M E. Thomas
Abstract
We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm-1 10000 cm-1 wave number range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm-1 and temperature dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of -5 is used for polarization selection. The uncertainties in the fringe counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.Proceedings Title
Cryogenic Optical Systems and Instruments , Conference | 9th | Cryogenic Optical Systems and Instruments IX | SPIE
Conference Dates
July 7-11, 2002
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering
Pub Type
Conferences
Keywords
absorption coefficient, index of refraxtion, sapphire, thermo-optic coefficient
Citation
Issues
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Created September 1, 2002, Updated February 17, 2017