Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K

Published

September 1, 2002

Author(s)

Simon G. Kaplan, M E. Thomas

Abstract

We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm^-1 10000 cm^-1 wave number range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm^-1 and temperature dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of -5 is used for polarization selection. The uncertainties in the fringe counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.

Proceedings Title

Cryogenic Optical Systems and Instruments , Conference | 9th | Cryogenic Optical Systems and Instruments IX | SPIE

Conference Dates

July 7-11, 2002

Conference Title

Proceedings of SPIE--the International Society for Optical Engineering

Pub Type

Conferences

Keywords

absorption coefficient, index of refraxtion, sapphire, thermo-optic coefficient

Citation

Kaplan, S. and Thomas, M. (2002), Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K, Cryogenic Optical Systems and Instruments , Conference | 9th | Cryogenic Optical Systems and Instruments IX | SPIE (Accessed October 22, 2025)