Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m
Simon G. Kaplan, Leonard M. Hanssen
We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence from 12 degrees to 80 degrees, and a spectral resolution of 16 cm-1. The measured values agree with the expected values obtained from the published index of refraction of Si to within +0.002. This represents a substantial reduction in experimental uncertainty compared to previous results and demonstrates the usefulness of Si as a standard material for infrared reflectance and transmittance.
Infrared Physics and Technology
index of refraction, infrared, polarization, reflectance, transmittance`
and Hanssen, L.
Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m, Infrared Physics and Technology
(Accessed October 2, 2023)