Kaplan, S.
and Hanssen, L.
(2002),
Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m, Infrared Physics and Technology
(Accessed April 29, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m
Published
Author(s)
,
Abstract
We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence from 12 degrees to 80 degrees, and a spectral resolution of 16 cm-1. The measured values agree with the expected values obtained from the published index of refraction of Si to within +0.002. This represents a substantial reduction in experimental uncertainty compared to previous results and demonstrates the usefulness of Si as a standard material for infrared reflectance and transmittance.Citation
Infrared Physics and Technology
Volume
43
Issue
No. 6
Pub Type
Journals
Keywords
index of refraction, infrared, polarization, reflectance, transmittance`
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 2002, Updated February 17, 2017