Hanssen, L.
and Kaplan, S.
(2003),
Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales, SPIE Proc
(Accessed June 13, 2025)
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Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
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SPIE Proc
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4826
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Created January 1, 2003, Updated February 17, 2017