TY  - JOUR
AU  - Hanssen, Leonard
AU  - Kaplan, Simon
C2  - SPIE Proc
DA  - 2003-01-01
LA  - en
M1  - 4826
PB  - SPIE Proc
PY  - 2003
TI  - Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
ER  -