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Displaying 51 - 75 of 81

Intercomparison of Regular Spectral Transmittance and Reflectance Measurements with FTIR- and Monochromator-Based Spectrophotometers

October 1, 2000

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, E A. Early, Maria E. Nadal

We have performed regular spectral transmittance and reflectance measurements over the 1 mm to 2.5 mm wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based

Angle-dependent absolute infrared reflectance and transmittance measurements

January 1, 2000

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Intercomparison of regular spectral transmittance and reflectance measurements with monochromator and FTIR based spectrophotometers

January 1, 2000

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, E A. Early, Maria E. Nadal

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

July 19, 1999

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

A Fourier transform infrared (FT-IR) spectrometer-based broadband infrared ellipsometer has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measured to

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

January 1, 1999

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Infrared diffuse reflectance instrumentation and standards at NIST

January 1, 1999

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

Characterization of High-OD Ultrathin Infrared Neutral Density Filters

October 8, 1998

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, Alan L. Migdall, G Lefever-Button

We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, free of

Characterization of Narrow-Band Infrared Interference Filters

October 8, 1998

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at normal

FT-IR Based Polarimeter with High-Quality Brewster-Angle Polarizers

October 8, 1998

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

A Fourier transform infrared (FT-IR) spectrometer based broadband infrared polarimeter has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measured to

Normal Infrared Spectral Emittance of Al 2 O 3

October 8, 1998

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

We have measured the near-normal ordinary ray transmittance and reflectance of crystalline Al 2O 3 from 1.6 m to 11 m and temperatures from 296 K to 582 K. The absorptance, or emittance, is derived from 1-(T+R), where T and R are the measured transmittance

Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared

July 19, 1998

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the V-W , V-N , and goniometer based methods, have

Infrared Diffuse Reflectance Instrumentation and Standards at NIST

June 29, 1998

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m to 18