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Characterization of High-OD Ultrathin Infrared Neutral Density Filters

Published

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, Alan L. Migdall, G Lefever-Button

Abstract

We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, free of etaloning effects over the 2 mm to 20 mm spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.
Citation
SPIE series

Keywords

infrared, neutral-density filter, transmittance

Citation

Kaplan, S. , Hanssen, L. , Migdall, A. and Lefever-Button, G. (1998), Characterization of High-OD Ultrathin Infrared Neutral Density Filters, SPIE series, [online], https://doi.org/10.1117/12.326679 (Accessed May 19, 2024)

Issues

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Created October 8, 1998, Updated November 10, 2018