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PUBLICATIONS

Characterization of High-OD Ultrathin Infrared Neutral Density Filters

Published

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, Alan L. Migdall, G Lefever-Button

Abstract

We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, free of etaloning effects over the 2 mm to 20 mm spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.
Citation
SPIE series
Pub Type
Journals

Download Paper

https://doi.org/10.1117/12.326679

Keywords

infrared, neutral-density filter, transmittance
Quantum information science

Citation

Kaplan, S. , Hanssen, L. , Migdall, A. and Lefever-Button, G. (1998), Characterization of High-OD Ultrathin Infrared Neutral Density Filters, SPIE series, [online], https://doi.org/10.1117/12.326679 (Accessed October 15, 2025)

Issues

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Created October 8, 1998, Updated November 10, 2018
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