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PUBLICATIONS

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

Published

Author(s)

Simon G. Kaplan, Leonard M. Hanssen
Proceedings Title
Conference Polarization: Measurement, Analysis and Remote Sensing II
Conference Location
Volume: 3754 Pages: 285-293, HU
Conference Title
Proc. SPIE Conference Polarization: Measurement, Analysis and Remote Sensing II
Pub Type
Conferences

Citation

Kaplan, S. and Hanssen, L. (1999), FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers, Conference Polarization: Measurement, Analysis and Remote Sensing II , Volume: 3754 Pages: 285-293, HU (Accessed October 22, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1999, Updated February 17, 2017
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