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FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

Published

Author(s)

Simon G. Kaplan, Leonard M. Hanssen
Proceedings Title
Conference Polarization: Measurement, Analysis and Remote Sensing II
Conference Location
Volume: 3754 Pages: 285-293, HU
Conference Title
Proc. SPIE Conference Polarization: Measurement, Analysis and Remote Sensing II

Citation

Kaplan, S. and Hanssen, L. (1999), FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers, Conference Polarization: Measurement, Analysis and Remote Sensing II , Volume: 3754 Pages: 285-293, HU (Accessed June 21, 2024)

Issues

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Created January 1, 1999, Updated February 17, 2017