TY  - CONF
AU  - Simon Kaplan
AU  - Leonard Hanssen
C2  - Conference Polarization: Measurement, Analysis  and Remote Sensing II , Volume: 3754 Pages: 285-293, HU
DA  - 1999-01-01
LA  - en
PB  - Conference Polarization: Measurement, Analysis  and Remote Sensing II , Volume: 3754 Pages: 285-293, HU
PY  - 1999
TI  - FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
ER  -