Kaplan, S.
and Gupta, R.
(2003),
High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed January 23, 2025)
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High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Published
Author(s)
,
Citation
Journal of Research (NIST JRES) -
Volume
108
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2003, Updated February 17, 2017