Publications

Displaying 101 - 125 of 378

Simulation of Electron Spectra for Surface Analysis (SESSA): A Novel Software Tool for Quantitative Auger-Electron Sspectroscopy and X-ray Photoelectron Spectroscopy

June 1, 2005

Author(s)

W Smekal, W S. Werner, Cedric J. Powell

A description is given of a new NIST database for quantitative Auger-electron and X-ray photoelectron spectroscopy (AES/XPS): Simulation of Electron Spectra for Surface Analysis (SESSA). This database contains extensive sets of data for the physical

Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solids in the 50 eV to 5000 eV Energy Range by Elastic-Peak Electron Spectroscopy

May 1, 2005

Author(s)

S Tanuma, T Shiratori, Tetsuya Kimura, K Goto, S Ichimura, Cedric J. Powell

We have determined electron inelastic mean free paths (IMFPs) in C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au by elastic-peak electron spectroscopy (EPES) using Ni as a reference material for electron energies between 50 eV and 5000 eV

Monte Carlo Strategies for Simulations of Electron Backscattering from Surfaces

May 1, 2005

Author(s)

Aleksander Jablonski, Cedric J. Powell, S Tanuma

Reliable algorithms for simulation of electron trajectories in solids are needed for quantification of Auger electron spectroscopy, particularly for determination of the backscattering factor (BF). The computational schemes for this purpose should be

Origin of Exchange Decoupling Effects in High-Coercivity Air-Annealed CoPd Multilayers

May 1, 2005

Author(s)

William F. Egelhoff Jr., Robert McMichael, J Mallett, Alexander J. Shapiro, Cedric J. Powell, John E. Bonevich, J H. Judy, J H. Thomas, Erik B. Svedberg

We have achieved excellent exchange decoupling of grains in CoPd multilayers by annealing in air at 300 C. Samples exhibit a slope in the hysteresis loop close to 1.0, nucleation fields as large as 1.1 T, and coercivities as large as 1.6 T. These are among

Calculations of Stopping Powers of 100 eV to 30 keV Electrons in Ten Elemental Solids

April 1, 2005

Author(s)

S Tanuma, Cedric J. Powell, David R. Penn

We present calculated electron stopping powers (SPs) for ten elemental solids (Al, Si, Cr, Ni, Cu, Ge, Pd, Ag, Pt, and Au). These calculations were made for electron energies between 100 eV and 30 keV, and were obtained using the same basic algorithm as

Characterization of Thin Films on the Nanometer Scale by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

April 1, 2005

Author(s)

Cedric J. Powell, Aleksander Jablonski, W S. Werner, W Smekal

We describe two NIST databases that can be used to characterize thin films from Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) measurements. First, the NIST Electron Effective-Attenuation-Length Database provides values of

Monte Carlo Simulations of Electron Transport in Solids: Applications to Electron Backscattering From Surfaces

April 1, 2005

Author(s)

Aleksander Jablonski, Cedric J. Powell

We report results of Monte Carlo simulations to investigate the effects of backscattered electrons in scanning Auger microscopy (SAM) on the radial distributions of emitted Auger electrons. We considered the emission of copper M 3VV and L 3VV Auger

Artifacts That Mimic Ballistic Magnetoresistance

February 1, 2005

Author(s)

William F. Egelhoff Jr., L Gan, H Ettedgui, Y Kadmon, Cedric J. Powell, P J. Chen, Alexander J. Shapiro, Robert McMichael, J Mallett, Thomas P. Moffat, Mark D. Stiles, Erik B. Svedberg

We have investigated the circumstances underlying recent reports of very large values of ballistic magntoresistance (BMR) in nanocontacts between magnetic wires. We find that the geometries used are subject to artifacts due to motion of the wires that

Calculations of Electron Inelastic Mean Free Paths. VIII. Data for 15 Elemental Solids Over the 50 eV to 2000 eV Range

January 1, 2005

Author(s)

S Tanuma, Cedric J. Powell, David R. Penn

We report calculations of electron inelastic mean free paths (IMFPs) for 50 eV to 2000 eV electrons in 14 elemental solids (Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, and Dy) and for one solid (Al) using better optical data than in our

ELSEPA - Dirac Partial-Wave Calculation of Elastic Scattering of Electrons and Positrons by Atoms, Positive Ions and Molecules

January 1, 2005

Author(s)

Francesc Salvat, Aleksander Jablonski, Cedric J. Powell

The FORTRAN 77 code system ELSEPA for the calculation of elastic scattering of electrons and positrons by atoms, postive ions and molecules is presented. These codes perform relativistic (Dirac) partial wave calculations for scattering by a local central

The Backscattering Factor in Auger-Electron Spectroscopy: New Approach for an Old Subject

January 1, 2005

Author(s)

Aleksander Jablonski, Cedric J. Powell

We describe an algorithm for the calculation of backscattering factors in Auger-electron spectroscopy that, unlike most previous analyses, is not based on the assumption of the probability of inner-shell ionization being independent of depth. Illustrative

Improvements in the Reliability of X-ray Photoelectron Spectroscopy for Surface Analysis

December 1, 2004

Author(s)

Cedric J. Powell

Interface Intermixing and In-Plane Grain Size in Aluminum-Transition Metal Bilayers

December 1, 2004

Author(s)

J D. Buchanan, T P. Hase, B K. Tanner, Cedric J. Powell, William F. Egelhoff Jr.

The correlation between grain size and intermixing in sputter deposited bilayers of the form X/Al and Al/X has been investigated by in-plane grazing incidence x-ray diffraction. We find a strong correlation between grain size and intermixing at the

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