Lu, R.
, Morgan, B.
, Kavanagh, K.
, Powell, C.
, Chen, P.
, Serpa, F.
and Egelhoff Jr., W.
(2000),
Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films, Journal of Vacuum Science and Technology
(Accessed April 26, 2024)
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Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films
Published
Author(s)
R P. Lu, B A. Morgan, K L. Kavanagh, , P J. Chen, ,
Abstract
We have used room temperature, ballistic electron emission microscopy (BEEM) to measure hot-electron transport through ultra-thin Au/Co multilayre structures deposited onto Si. The samples consist of Au/Co/Si or (Au/Co)n/AuSi diodes, sputter deposited at 175K to 300K, where n is the number of repeat layers.Citation
Journal of Vacuum Science and Technology
Volume
18
Pub Type
Journals
Keywords
ballistic electron emission microscopy (, hot electrons, interfacial scattering
Citation
Created December 31, 1999, Updated October 12, 2021