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Search Publications by: Cedric J Powell (Assoc)

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Displaying 76 - 100 of 190

Electron Effective Attenuation Lengths in Electron Spectroscopies

January 1, 2004
Author(s)
Aleksander Jablonski, Cedric J. Powell
An important measure of the opacity of a solid with respect to monoenergetic electrons in a solid is the effective attenuation length (EAL). However, there is much controversy in the literature concerning the definition of this parameter. It has been shown

Measurement of Gate-Oxide Film Thickness by X-ray Photoelectron Spectroscopy

September 1, 2003
Author(s)
Cedric J. Powell, Aleksander Jablonski
X-Ray Photoelectron Spectroscopy (XPS) is being used to an increasing extent for the characterization of new gate-oxide materials, particularly for the determination of film composition, uniformity, and thickness. A key parameter for film-thickness

Intermixing of Aluminum-Magnetic Transition Metals Bilayers

May 1, 2003
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.
Grazing incidence x-ray scattering has been used to study interfacial intermixing in thin films of aluminum/transition metal bilayers grown by dc magnetron sputter deposition at room temperature. As with all transition metals, the ferromagnets Fe, Co and

Anomalously Large Intermixing in Aluminium-Transition Metal Bilayers

September 1, 2002
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.
The interdiffusion lengths in thin film samples of the form X/Al and Al/X, where X is a metal from rows 4,5 and 6 of the Periodic Table, have been measured by Grazing Incidence X-ray Scattering. Scans of the specular reflectivity have been fitted to

Ultra-Thin Aluminum Oxide as a Thermal Oxidation Barrier on Metal Films

August 1, 2002
Author(s)
L Gan, Romel Gomez, Audie M. Castillo, P J. Chen, Cedric J. Powell, William F. Egelhoff Jr.
We have investigated the role of aluminum oxide films as barriers to thermal oxidation of Co, Ni, Fe, NiFe, Mn, Ta, Cu Al and Cr in air. The oxidation of the film is monitored by measuring the electrical resistance following a brief anneal in air. We find

The NIST Electron Effective-Attenuation-Length Database

February 1, 2002
Author(s)
Cedric J. Powell, Aleksander Jablonski
The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide

Development of the Web-Based NIST X-Ray Photoelectron Spectroscopy (XPS) Database

January 1, 2002
Author(s)
Angela Y. Lee, D M. Blakeslee, Cedric J. Powell, J R. Rumble
The first web-based version of the NIST X-ray Photoelectron Spectroscopy Database (XPSDB) is described. The current database, built from a relational database management system (RDBMS), contains critically evaluated data with over 19,000 line positions

Structural Effects in the Growth of Giant Magneto Resistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P. J. Chen, Cedric J. Powell, Robert D. McMichael, William F. Egelhoff Jr.
An investigation has been made of the thin-film structure and interface morphology of giant magnetoresistance (GMR) spin valves of the cobalt/copper/cobalt (Co/Cu/Co) type that were grown on polycrystalline NiO substrates at three different temperatures

Structural Effects in the Growth of Giant Magnetoresistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P J. Chen, Cedric J. Powell, Robert McMichael, William F. Egelhoff Jr.
Giant magnetoresistance (GMR) spin valves of the Co/Cu/Co type were grown on polycrystalline NiO substrates at three different temperatures. The GMR values and growth temperatures were: 14% for 150 K growth, 10% for 300 K growth, and 0% for 450 K growth

Surface and Interface Effects in the Growth of Giant Magnetoresistance Spin Valves for Ultrahigh-Density Data-Storage Applications

August 1, 2001
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Robert D. McMichael, Mark D. Stiles
The current generation of hard disk drives use Giant Magnetoresistance (GMR) spin valves as the read-head because the GMR effect is currently the most sensitive way to detect magnetic fields at submicron length scales and data rates of {approximately equal

Surface Oxidation as a Diffusion Barrier for Al Deposited on Ferromagnetic Metals

May 1, 2001
Author(s)
William F. Egelhoff Jr., P J. Chen, Robert D. McMichael, Cedric J. Powell, R Deslattes, F G. Serpa, Romel Gomez
We have used Grazing Incidence X-ray Reflectometry (GIXR) to study surface oxidation as a diffusion barrier for Al deposited on ferromagnetic metals (Co, Fe, Ni, and NiFe). Samples of the form SiO2 // 10nm X / 4nm Al and SiO2 // 10nm X/ 4nm Au with X = (Co
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