NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Cedric J. Powell, Aleksander Jablonski
A brief description is given of four databases issued by the National Institute of Standards and Technology (NIST) for applications in surface analysis by Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS). These databases are: the NIST X-Ray Photoelectron Spectroscopy Database, the NIST Electron Inelastic-Mean-Free-Path Database, and the NIST Electron Effective-Attenuation-Length Database. The purposes and features of these databases are described, and examples are given of data that can be provided.