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NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Published
Author(s)
Cedric J. Powell, Aleksander Jablonski
Abstract
A brief description is given of four databases issued by the National Institute of Standards and Technology (NIST) for applications in surface analysis by Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS). These databases are: the NIST X-Ray Photoelectron Spectroscopy Database, the NIST Electron Inelastic-Mean-Free-Path Database, and the NIST Electron Effective-Attenuation-Length Database. The purposes and features of these databases are described, and examples are given of data that can be provided.
Powell, C.
and Jablonski, A.
(2003),
NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy, Surface and Interface Analysis
(Accessed December 2, 2023)