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PUBLICATIONS

NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Published

Author(s)

Cedric J. Powell, Aleksander Jablonski

Abstract

A brief description is given of four databases issued by the National Institute of Standards and Technology (NIST) for applications in surface analysis by Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS). These databases are: the NIST X-Ray Photoelectron Spectroscopy Database, the NIST Electron Inelastic-Mean-Free-Path Database, and the NIST Electron Effective-Attenuation-Length Database. The purposes and features of these databases are described, and examples are given of data that can be provided.
Citation
Surface and Interface Analysis
Pub Type
Journals

Keywords

Auger-electron spectroscopy, cross sections, databases, effective attenuation lengths, elastic scattering, electron, inelastic scattering, surface analysis, x-ray photoelectron spectroscopy

Citation

Powell, C. and Jablonski, A. (2003), NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy, Surface and Interface Analysis (Accessed December 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 1, 2003, Updated February 17, 2017