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Anomalously Large Intermixing in Aluminium-Transition Metal Bilayers

Published

Author(s)

J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.

Abstract

The interdiffusion lengths in thin film samples of the form X/Al and Al/X, where X is a metal from rows 4,5 and 6 of the Periodic Table, have been measured by Grazing Incidence X-ray Scattering. Scans of the specular reflectivity have been fitted to determine the total interface width, and within the kinematical limit we deduce the interdiffusion profile at the interface and separate it from the topological roughness. The interdiffusion length for X on Al is greater than for Al on X. Bulk diffusion coefficients are found not to give an adequate measure of the interdiffusion widths of nanoscale interfaces in these films.
Citation
Physical Review B (Condensed Matter and Materials Physics)
Volume
66
Issue
No. 10

Keywords

aluminum, grazing incidence x-ray, interdiffusion, reflectometry, transition metals

Citation

Buchanan, J. , Hase, T. , Tanner, B. , Chen, P. , Gan, L. , Powell, C. and Egelhoff Jr., W. (2002), Anomalously Large Intermixing in Aluminium-Transition Metal Bilayers, Physical Review B (Condensed Matter and Materials Physics) (Accessed May 29, 2024)

Issues

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Created August 31, 2002, Updated October 12, 2021