Powell, C.
(2000),
NIST Data Resources for X-Ray Photoelectron Spectroscopy, Surface and Interface Analysis
(Accessed October 13, 2025)
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NIST Data Resources for X-Ray Photoelectron Spectroscopy
Published
Author(s)
Abstract
A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic-Electron-Scattering Cross-Section Database (SRD 64), and an Electron Inelastic-Mean-Free-Path Database (SRD 71). NIST also offers Standard Test Data for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet; these spectra are available over the internet.Citation
Surface and Interface Analysis
Volume
29
Issue
10
Pub Type
Journals
Keywords
databases, reference data, standard test data, surface analysis, x-ray photoelectron spectroscopy
Citation
Issues
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Created October 1, 2000, Updated February 19, 2017