Suzuki, M.
, Ando, H.
, Higashi, Y.
, Takenaka, H.
, Shimada, H.
, Matsubayashi, N.
, Imamura, M.
, Kurosawa, S.
, Tanuma, S.
and Powell, C.
(2000),
Experimental Determination of Electron Effective Attenuation Lengths in Silicon Dioxide Thin Films Using Synchrotron Radiation - I. Data Analysis and Comparisons, Surface and Interface Analysis
(Accessed December 8, 2024)