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Search Publications by: Cedric J Powell (Assoc)

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Displaying 126 - 150 of 378

Interface Intermixing and In-Plane Grain Size in Aluminum-Transition Metal Bilayers

December 1, 2004
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, Cedric J. Powell, William F. Egelhoff Jr.
The correlation between grain size and intermixing in sputter deposited bilayers of the form X/Al and Al/X has been investigated by in-plane grazing incidence x-ray diffraction. We find a strong correlation between grain size and intermixing at the

Differential Cross Sections for Elastic Scattering of Electrons by Atoms and Solids

July 1, 2004
Author(s)
Aleksander Jablonski, Francesc Salvat, Cedric J. Powell
Differential cross sections (DCSs) for elastic scattering of electrons by neutral atoms are extensively used in studies of electron transport in solids and liquids. A new NIST database has recently been released with DCSs calculated from a relativistic

Summary of ISO/TC 201 Technical Report: ISO/TR 19319: 2003 Surface Chemical Analysis Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy Determination of Lateral Resolution, Analysis Area, and Sample Area Viewed by the Analyser

July 1, 2004
Author(s)
Cedric J. Powell
ISO Technical Report 19319 contains information on the determination of lateral resolution, analysis area, and sample area viewed by the analyser in surface analyses by Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). This

Artifacts in Ballistic Magnetoresistance Measurements

June 1, 2004
Author(s)
William F. Egelhoff Jr., L Gan, H Ettedgui, Y Kadmon, Cedric J. Powell, P J. Chen, Alexander J. Shapiro, Robert McMichael, J Mallett, Thomas P. Moffat, Mark D. Stiles, Erik B. Svedberg
We have studied the behavior of electrodeposited Ni and Fe nanocontacts in magnetic fields and the changes in resistivity (Δ}R) that occur. Metallic particles suspended in plating solution, created and collected from the electroplating bath of a

Artifacts in Ballistic Magnetoresistance Measurements

June 1, 2004
Author(s)
William F. Egelhoff Jr., L Gan, H Ettendgui, Y Kadmon, Cedric J. Powell, P J. Chen, Alexander J. Shapiro, Robert McMichael, J Mallett, Thomas P. Moffat, Mark D. Stiles
We have carried out an extensive search for credible evidence to support the existence of a ballistic magnetoresistance (BMR) effect in magnetic nanocontacts. We have investigated both thin-film and thin-wire geometries for both mechanically-formed and

Information Depth for Elastic-Peak Electron Spectroscopy

February 1, 2004
Author(s)
Aleksander Jablonski, Cedric J. Powell
We present a formalism for calculating the information depth (ID) for elastic-peak electron spectroscopy (EPES) in which a measurement is made of the intensity of elastically-backscattered electrons for an amorphous or polycrystalline material and a

Artifacts that mimic ballistic magnetoresistance

January 1, 2004
Author(s)
William F. Egelhoff Jr., L Gan, Erik B. Svedberg, Cedric J. Powell, Alexander J. Shapiro, Robert McMichael, J Mallett, Thomas P. Moffat, Mark D. Stiles
We have investigated the circumstances underlying recent reports of very large values of ballistic magnetoresistance (BMR) in nanocontacts between magnetic wires. We find that the geometries used are subject to artifacts due to motion of the wires that

Coercivities above 10 kOe in CoPd Superlattices

January 1, 2004
Author(s)
William F. Egelhoff Jr., Cedric J. Powell, L Gan, P J. Chen, H Ettendgui, D Tirosh, Robert McMichael, Mark D. Stiles, J Mallett, Alexander J. Shapiro, John E. Bonevich
We have achieved excellent grain isolation in CoPd superlattices by using 10 nm Au as both an underlayer and an overlayer and diffusing Au into the grain boundaries by annealing for approximately equal to} 30 min. at 300 degrees C. The grain isolation

Electron Effective Attenuation Lengths in Electron Spectroscopies

January 1, 2004
Author(s)
Aleksander Jablonski, Cedric J. Powell
An important measure of the opacity of a solid with respect to monoenergetic electrons in a solid is the effective attenuation length (EAL). However, there is much controversy in the literature concerning the definition of this parameter. It has been shown