U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Cedric J Powell (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 151 - 175 of 378

Measurement of Gate-Oxide Film Thickness by X-ray Photoelectron Spectroscopy

September 1, 2003
Author(s)
Cedric J. Powell, Aleksander Jablonski
X-Ray Photoelectron Spectroscopy (XPS) is being used to an increasing extent for the characterization of new gate-oxide materials, particularly for the determination of film composition, uniformity, and thickness. A key parameter for film-thickness

Intermixing of Aluminum-Magnetic Transition Metals Bilayers

May 1, 2003
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.
Grazing incidence x-ray scattering has been used to study interfacial intermixing in thin films of aluminum/transition metal bilayers grown by dc magnetron sputter deposition at room temperature. As with all transition metals, the ferromagnets Fe, Co and

Anomalously Large Intermixing in Aluminium-Transition Metal Bilayers

September 1, 2002
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.
The interdiffusion lengths in thin film samples of the form X/Al and Al/X, where X is a metal from rows 4,5 and 6 of the Periodic Table, have been measured by Grazing Incidence X-ray Scattering. Scans of the specular reflectivity have been fitted to

Ultra-Thin Aluminum Oxide as a Thermal Oxidation Barrier on Metal Films

August 1, 2002
Author(s)
L Gan, Romel Gomez, Audie M. Castillo, P J. Chen, Cedric J. Powell, William F. Egelhoff Jr.
We have investigated the role of aluminum oxide films as barriers to thermal oxidation of Co, Ni, Fe, NiFe, Mn, Ta, Cu Al and Cr in air. The oxidation of the film is monitored by measuring the electrical resistance following a brief anneal in air. We find

The NIST Electron Effective-Attenuation-Length Database

February 1, 2002
Author(s)
Cedric J. Powell, Aleksander Jablonski
The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide

Development of the Web-Based NIST X-Ray Photoelectron Spectroscopy (XPS) Database

January 1, 2002
Author(s)
Angela Y. Lee, D M. Blakeslee, Cedric J. Powell, J R. Rumble
The first web-based version of the NIST X-ray Photoelectron Spectroscopy Database (XPSDB) is described. The current database, built from a relational database management system (RDBMS), contains critically evaluated data with over 19,000 line positions