Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Effects of Elastic and Inelastic Electron-scattering on Quantitative Surface Analysis by A.E.S. and X.P.S

Published

Author(s)

Cedric J. Powell, E Jablonski, Shigeo Tanuma, David R. Penn

Abstract

A review is given that describes the complications due to elastic and inelastic electron scattering in quantitative surface analyses by Auger-electron spectroscopy and x-ray photoelectron spectroscopy. Four principal topics are addressed. First, the simple formulae for surface analyses are based on a model that ignores elastic scattering. Recent work assessing the effects of elastic scattering is summarized which shows that the simple formulae are valid in certain analytical situations but with an appropriate choice of the parameter describing inelastic scattering. Second, we review measurements of effective attentuation lengths and point out many sources of significant systematic error in these measurements. Third, we describe recent calculations of inelastic mean free paths (IMFPs) in over fifty materials that have been utilized to develop a predictive IMFP formula. Finally, we discuss the complicating effects of inelastics scattering on reliable measurements of AES and XPS intensities.
Citation
Journal of Electron Spectroscopy and Related Phenomena
Volume
68

Citation

Powell, C. , Jablonski, E. , Tanuma, S. and Penn, D. (1994), Effects of Elastic and Inelastic Electron-scattering on Quantitative Surface Analysis by A.E.S. and X.P.S, Journal of Electron Spectroscopy and Related Phenomena (Accessed June 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1993, Updated October 12, 2021