Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy

Published

Author(s)

Cedric J. Powell

Abstract

Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effects in the determination of line intensities are discussed and a suitable procedure for determining intensities is described. The satisfactory agreement between computed and measured intensities confirms the validity and utility of the photoemission model and associated data, and indicates that quantitative analyses of homogeneous single-phase surfaces can be obtained by X-ray photoelectron spectroscopy.
Citation
Applications of Surface Science
Volume
1
Issue
2

Citation

Powell, C. (1978), Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy, Applications of Surface Science (Accessed April 17, 2024)
Created January 1, 1978, Updated February 19, 2017