Powell, C.
(1978),
Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy, Applications of Surface Science
(Accessed March 6, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy
Published
Author(s)
Abstract
Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effects in the determination of line intensities are discussed and a suitable procedure for determining intensities is described. The satisfactory agreement between computed and measured intensities confirms the validity and utility of the photoemission model and associated data, and indicates that quantitative analyses of homogeneous single-phase surfaces can be obtained by X-ray photoelectron spectroscopy.Citation
Applications of Surface Science
Volume
1
Issue
2
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1978, Updated February 19, 2017