Powell, C.
, Rumble, J.
, J, R.
, Blakeslee, D.
, Dal-favero, M.
, Jablonski, A.
and Tougaard, S.
(1998),
The NIST Surface Analysis Data Center, 1998 International Conference in Characterization and Metrology, PA
(Accessed December 13, 2024)
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The NIST Surface Analysis Data Center
Published
Author(s)
, , R J, , M E. Dal-favero, Aleksander Jablonski, Sven Tougaard
Proceedings Title
1998 International Conference in Characterization and Metrology
Conference Location
PA
Conference Title
Proceedings of the 1998 International Conference in Characterization and Metrology
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 1998, Updated February 17, 2017