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NIST Authors in Bold

Displaying 2101 - 2125 of 4226

Ontological Product Modeling for Collaborative Design

July 22, 2010
Author(s)
Conrad E. Bock, XuanFang Zha, Hyo-won Suh, Jae H. Lee
This paper shows how to combine ontological and model-based techniques in languages that facilitate collaborative design exploration. The proposed approach uses ontology to capture alternative designs and incremental refinements that meet requirements and

Reference Material (RM) 8820: A Versatile New NIST Standard for Nanometrology

July 19, 2010
Author(s)
Michael T. Postek, Andras Vladar, William J. Keery, Michael R. Bishop, Benjamin Bunday, John Allgair
A new multipurpose instrument calibration standard has been released by NIST. This standard was developed to be used primarily for X and Y scale (or magnifi cation) calibrations of scanning electron microscopes from less than 10 times magnification to more

Choosing test positions for laser tracker evaluation and future Standards development

July 15, 2010
Author(s)
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Craig M. Shakarji, Ed Morse, Robert Bridges
A working group within the ISO TC 213 committee is developing a draft document [11] for evaluating the performance of laser trackers. The ASME B89.4.19 Standard [1] and the draft VDI/VDE 2617 part 10 [2] describe some useful tests that are incorporated

2009 Performance Metrics for Intelligent Systems (PerMIS'09) Workshop

July 9, 2010
Author(s)
Rajmohan Madhavan, Elena R. Messina
The Performance Metrics for Intelligent Systems (PerMIS) workshop is dedicated to defining measures and methodologies of evaluating performance of intelligent systems. The main theme of the ninth iteration of the workshop, PerMIS'09, addressed the question

High-voltage Nanoimprint Lithography of Refractory Metal Film

July 1, 2010
Author(s)
John A. Dagata, Natalia Farkas, R Ramsier
Local oxidation of metal, semiconductor, and polymer surfaces has provided a common basis from which to explore fundamental principles of nanolithography and prototype functional nanostructures for many years now. This article summarizes an investigation

Developing a Sustainability Manufacturing Maturity Model

June 30, 2010
Author(s)
Mahesh Mani
Sustainable manufacturing (SM) broadly implies the development of innovative manufacturing sciences and technologies that span the life cycle of products and services to minimize negative environmental impacts, conserve energy and natural resources, are

Testing Interoperability Standards - A Test Case Generation Methodology

June 16, 2010
Author(s)
Nenad Ivezic, Jungyub Woo
Over many years, National Institute of Standards and Technology (NIST) built test beds to support interoperability standards development and their implementation within software applications. A general test framework has been proposed to enhance new test

Dark pulse quantum dot diode laser

June 7, 2010
Author(s)
Mingming M. Feng, Kevin L. Silverman, Richard P. Mirin, Steven T. Cundiff
We describe an operating regime for passively mode-locked quantum dot diode laser where the output consists of a train of dark pulses, i.e., intensity dips on a continuous background. We show that a dark pulse train is a solution to the master equation for

Cylindrical Acoustic Resonator for the Re-determination of the Boltzmann Constant

June 1, 2010
Author(s)
J.T. Zhang, H. Lin, X.J. Feng, Keith A. Gillis, Michael R. Moldover
We describe progress towards re-determining the Boltzmann constant k B using two fixed-path, gas-filled, cylindrical, acoustic cavity resonators. The longitudinal acoustic resonance modes of a cylindrical cavity have lower quality factors Q than the radial

Feasibility of an Accurate Dynamic Standard for Water Flow

June 1, 2010
Author(s)
Iosif I. Shinder, Michael R. Moldover
We used NIST's primary water flow standard to study the feasibility of accurately determining mass flow rates m dot of water "dynamically," that is from the time derivative of the weight W of the collection tank: m dot,dynamic = (dW/dt)/g. When data for a

Modeling and metrology of metallic nanowires with application to microwave interconnects

May 23, 2010
Author(s)
Kichul Kim, Thomas M. Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang
Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microwire Au
Displaying 2101 - 2125 of 4226
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