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Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been developed. It has potentially significant advantages over the previous methods.
Villarrubia, J.
(1995),
Progress in Tip Modeling, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 10, 2025)