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Progress in Tip Modeling



John S. Villarrubia


Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been developed. It has potentially significant advantages over the previous methods.
NIST Interagency/Internal Report (NISTIR) - 5640
Report Number


AFM, atomic force microscopy, blind reconstruction, dimensional metrology, mathematical morphology, scanned probe microscopy, scanning tunneling microscopy, SPM, STM, tip artifacts, tip estimation


Villarrubia, J. (1995), Progress in Tip Modeling, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 13, 2024)


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Created January 1, 1995, Updated February 19, 2017