Villarrubia, J.
(1995),
Progress in Tip Modeling, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed May 9, 2025)
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Progress in Tip Modeling
Published
Author(s)
Abstract
Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been developed. It has potentially significant advantages over the previous methods.Citation
NIST Interagency/Internal Report (NISTIR) - 5640
Report Number
5640
NIST Pub Series
Pub Type
NIST Pubs
Keywords
AFM, atomic force microscopy, blind reconstruction, dimensional metrology, mathematical morphology, scanned probe microscopy, scanning tunneling microscopy, SPM, STM, tip artifacts, tip estimation
Citation
Issues
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Created January 1, 1995, Updated February 19, 2017