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Progress in Tip Modeling

Published

Author(s)

John S. Villarrubia

Abstract

Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been developed. It has potentially significant advantages over the previous methods.
Citation
NIST Interagency/Internal Report (NISTIR) - 5640
Report Number
5640

Keywords

AFM, atomic force microscopy, blind reconstruction, dimensional metrology, mathematical morphology, scanned probe microscopy, scanning tunneling microscopy, SPM, STM, tip artifacts, tip estimation

Citation

Villarrubia, J. (1995), Progress in Tip Modeling, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1995, Updated February 19, 2017