Lowney, J.
and Marx, E.
(1995),
User's Manual for the Program MONEL-I: Monte Carlo Simulation of SEM Signals for Linewidth Metrology, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 8, 2024)
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User's Manual for the Program MONEL-I: Monte Carlo Simulation of SEM Signals for Linewidth Metrology
Published
Author(s)
,
Abstract
This user's manual is a guide to the FORTRAN code MONSEL-I which is a Monte Carlo simulation of the transmitted and backscattered electron signals in a scanning electron microscope (SEM) associated with a line specimen with a trapezoidal cross section. The line is deposited on a multi-layer substrate. The primary purpose of the code is to determine the actual linewidth from measured SEM signals. However, it can be used for many other purposes such as transmission electron microscopy. Future extensions to model secondary electron signals and multiple lines are planned.Citation
Technical Note (NIST TN) - 400
Report Number
400
NIST Pub Series
Pub Type
NIST Pubs
Keywords
backscattered electrons, electron transmission, linewidth, Monte Carlo simulation, scanning electron microscope, X?ray lithography
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1994, Updated October 12, 2021