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Displaying 60951 - 60975 of 74635

High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride

December 31, 1991

Author(s)

Joseph Kopanski, J R. Lowney, Donald B. Novotny, David G. Seiler, A. Simmons, J. Ramsey

Insulated Gate Bipolar Transistor (IGBT) Modeling Using IG-Spice

December 31, 1991

Author(s)

C. S. Mitter, Allen R. Hefner Jr., D X. Chen, F. C. Lee

Intrinsic Carrier Concentrations in Long Wavelength HgCdTe Based on the New, Nonlinear Temperature Dependence of Eg(x,T)

December 31, 1991

Author(s)

David G. Seiler, J R. Lowney, Chris L. Littler, I. T. Yoon

Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements

December 31, 1991

Author(s)

D. Khera, Loren W. Linholm, Richard A. Allen, Michael W. Cresswell, V. C. Tyree, W. Hansford, C. Pina

Measurement of Interface Defects in Gated SIMOX Structures

December 31, 1991

Author(s)

Santos D. Mayo, J R. Lowney, Peter Roitman

Measurement, Use, and Interpretation of TCR

December 31, 1991

Author(s)

Harry A. Schafft

Microchannel-Plate Detection Systems for Low Accelerating Voltage SEM

December 31, 1991

Author(s)

Michael T. Postek

Microstructural Changes in Oxygen Implanted SOI Material at Intermediate Annealing Steps in Thermal Ramping

December 31, 1991

Author(s)

J Park, S. J. Krause, Peter Roitman

Numerical Modeling of Short-Wavelength Internal Quantum Efficiency

December 31, 1991

Author(s)

Jon Geist, Deane Chandler-Horowitz, Tina Kohler, A. M. Robinson, C. James

Oxygen Bubble Formation and Evolution During Oxygen Implantation and Annealing of Silicon-on-Insulator Material

December 31, 1991

Author(s)

S. J. Krause, J. H. Lee, B. L. Chen, S. Seraphin, B. F. Cordts, Peter Roitman

Periodicities Associated with Low-Order AlAs/GaAs Superlattices

December 31, 1991

Author(s)

Joseph G. Pellegrino, S. B. Qadri, W. F. Tseng, J. Comas

Quantitative Analysis of Impurities in SIMOX Samples Using Secondary Ion Mass Spectrometry

December 31, 1991

Author(s)

P Chi, David S. Simons, Peter Roitman

Quantitative Depth Profiling of Aluminum-Implanted SIMOX by Use of Secondary Ion Mass Spectrometry

December 31, 1991

Author(s)

P Chi, David S. Simons, Peter Roitman, H. L. Hughes

SEM Imaging and Metrology at Low Accelerating Voltages Using Backscattered Electrons

December 31, 1991

Author(s)

Michael T. Postek

STM Pattern Generation on Silicon and GaAs Surfaces

December 31, 1991

Author(s)

John A. Dagata, J. Schneir, Howard H. Harary, C J. Evans, Michael T. Postek, J. Bennett, W. F. Tseng

Test Chip for the Evaluation of Surface Diffusion Phenomena in Sputtered Aluminum Planarization Processes

December 31, 1991

Author(s)

M. A. Jones, John W. Roberts, Colleen E. Hood, Michael W. Cresswell, Richard A. Allen

The Application of Transmission Electron Detection to X-ray Mask Calibrations and Inspection

December 31, 1991

Author(s)

Michael T. Postek, Robert D. Larrabee, William J. Keery, E Marx

The Role of Annealing Conditions on the Radiation Response of Backgate MOSFETs, Extended Abstract

December 31, 1991

Author(s)

G. J. Campisi, Peter Roitman, G. J. Shontz

The Shubnikov-de Haas Effect in Semiconductors: A Comprehensive Review of Experimental Aspects

December 31, 1991

Author(s)

David G. Seiler, A. E. Stephens

Tunneling Spectroscopy of High Critical Temperature Superconductors Using SET Junctions

December 31, 1991

Author(s)

a Walsh, John M. Moreland, Ronald H. Ono, James A. Beall, M. W. Cromar, Todd E. Harvey, Carl D. Reintsema, T. S. Kalkur

Two-Dimensional Arrays of Josephson Junctions as Voltage-Tunable Oscillators

December 31, 1991

Author(s)

Samuel P. Benz, Charles J. Burroughs

Use of Ion Scattering Spectroscopy to Monitor the Nb Target Mitridation During Reactive Sputtering

December 31, 1991

Author(s)

D. J. Lichtenwalner, A. C. Anderson, David A. Rudman

Verification of Effective Intrinsic Carrier Concentrations for Numerical Simulations of Gallium Arsenide Bipolar Transistors, Extended Abstract

December 31, 1991

Author(s)

M. Tomizawa, T. Ishibashi, Herbert S. Bennett, J R. Lowney

XANES of Transition Metal Zinc-Blende Semiconductors, X-ray Absorption Fine Structure

December 31, 1991

Author(s)

D. A. McKeown

Coherent Quasielastic Neutron Scattering Study of the Rotational Dynamics of C 60 in the Orientationally Disordered Phase

December 30, 1991

Author(s)

Dan Neumann, John R. Copley, Ronald L. Cappelletti, William A. Kamitakahara, Richard M. Lindstrom, K. M. Creegan, D. M. Cox, W. J. Romanow, N. Coustel, J. P. McCauley, Jr., N. C. Maliszewskyj, John E. Fischer, A. B. Smith, III

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