Chi, P.
, Simons, D.
and Roitman, P.
(1991),
Quantitative Analysis of Impurities in SIMOX Samples Using Secondary Ion Mass Spectrometry, Surface and Interface Analysis
(Accessed May 7, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Quantitative Analysis of Impurities in SIMOX Samples Using Secondary Ion Mass Spectrometry
Published
Author(s)
, ,
Citation
Surface and Interface Analysis
Volume
17
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1991, Updated October 12, 2021